Used Semiconductor Equipment

Wafer Size 300 mm Fab Section Failure Analysis Tool Available Date 2024-08-27 General Product Information Vin Year(s) : 2011 Location : United States (USA)

Price : On request

Wafer Size 300 mm Fab Section Defect Detection General Product Information Vendor Supplier AMAT Model UVision Year(s) : 2014 Location : United States (USA)

Price : On request

Wafer Size 200 mm Fab Section Implant General Product Information Software Version 13.42.18 CIM GEM and SECS Year(s) : 2007 Location : United States (USA)

Price : On request

Wafer Size 300 mm Fab Section Lab General Product Information Vendor Supplier FEI Model FEI ExSolve CLM Next Year(s) : 2016 Location : United States (USA)

Price : On request

Wafer Size 200 mm Fab Section Clean General Product Information Vendor Supplier Fusion Semiconductor Model 20 Year(s) : 1993 Location : United States (USA)

Price : On request

Wafer Size 200 mm Fab Section Etch General Product Information Vendor Supplier GASONICS INTERNATIONAL Model P Year(s) : 2000 Location : United States (USA)

Price : On request

Fab Section Failure Analysis General Product Information Vendor Supplier BRUKER Model D8 Davinci Vintage 2013 Year(s) : 2013 Location : United States (USA)

Price : On request

Wafer Size 300 mm Fab Section Defect Detection General Product Information Vendor Supplier AMAT Model UVISION Year(s) : 2013 Location : United States (USA)

Price : On request

Wafer Size 200 mm Fab Section Diffusion General Product Information Vendor Supplier TOKYO ELECTRON LIMITED Mo Year(s) : 1995 Location : United States (USA)

Price : On request

Wafer Size 200 mm Fab Section Diffusion General Product Information Vendor Supplier TOKYO ELECTRON LIMITED Mo Year(s) : 1996 Location : United States (USA)

Price : On request

Wafer Size 200 mm Fab Section Diffusion General Product Information Vendor Supplier TOKYO ELECTRON LIMITED Mo Year(s) : 1993 Location : United States (USA)

Price : On request

Wafer Size 300 mm Fab Section Metrology General Product Information Vendor Supplier KLA Model Archer A500 AIM Year(s) : 2014 Location : United States (USA)

Price : On request

Wafer Size 300 mm Fab Section Metrology General Product Information Vendor Supplier KLA-TENCOR Model EDR 5210 Year(s) : 2010 Location : United States (USA)

Price : On request

Wafer Size 200 mm Fab Section Thin Film General Product Information Vendor Supplier Lam Research Model Novell Year(s) : 2000 Location : United States (USA)

Price : On request

Wafer Size 300 mm Fab Section Metrology General Product Information Vendor Supplier BRUKER Model D8 Fabline V Year(s) : 2014 Location : United States (USA)

Price : On request

Wafer Size 200 mm Fab Section Thin Film General Product Information Vendor Supplier Lam Research Model Novell Year(s) : 2000 Location : United States (USA)

Price : On request

Wafer Size 200 mm Fab Section Clean General Product Information Vendor Supplier CFM Model FullFlow 1/99 8100 Year(s) : 1999 Location : United States (USA)

Price : On request

Wafer Size 200 mm Fab Section Thin Film General Product Information Vendor Supplier AMAT Model ENDURA P5500 V Year(s) : 2000 Location : United States (USA)

Price : On request

Wafer Size 200 mm Fab Section Clean General Product Information Vendor Supplier CFM Model FullFlow 1/99 8100 Year(s) : 1999 Location : United States (USA)

Price : On request

Wafer Size 300 mm Fab Section Thin Film General Product Information Vendor Supplier AMAT Model Producer SE Vi Year(s) : 2011 Location : United States (USA)

Price : On request

OP2600DUVI, 200mm, s/n: 6454 Year(s) : 1997 Location : United States (USA)

Price : On request

OP3260I, 200mm, s/n: 6678 Year(s) : 1998 Location : United States (USA)

Price : On request

Scanning Electron Microscopes Year(s) : 2008 Location : United States (USA)

Price : On request

EDR 5210, 300mm, s/n: 5040135 Year(s) : 2010 Location : United States (USA)

Price : On request

200mm, s/n: 97-46-5419 Year(s) : 2000 Location : United States (USA)

Price : On request