Used Semiconductor Equipment

Wafer Size 300 mm Fab Section Lithography General Product Information Vendor Supplier TEL Model LITHIUS Vinta Year(s) : 2005 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Inspection: Profilometer Year(s) : 1999 Location : ASIA (North East)

Price : On request

Mounter Wafer Size Range Set Size 200 mm Condition Good Year(s) : 1996 Location : EUROPE (Western and Northern)

Price : On request

Defolieranlage Condition Very Good Power Requirements Other V 50 Hz 3 Phase Year(s) : 2011 Location : EUROPE (Western and Northern)

Price : On request

Oxid Prozess Wafer edge cleaner, EVCII PC, SW 8.601 Conditioner new type Flowcontroller für Slurry #2, additio Year(s) : 1999 Location : EUROPE (Western and Northern)

Price : On request

Wafer Size 300 mm Fab Section Lithography General Product Information Vendor Supplier ASML Model NXT1950i Vin Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Wafer Size 300 mm Fab Section Lithography General Product Information Vendor Supplier ASML Model XT1400E Vint Year(s) : 2007 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Wafer Size 300 mm Fab Section Lithography General Product Information Vendor Supplier ASML Model XT1900Gi Vin Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

double rail; CPK2.6; 30 type camera--4pcs; nozzle--48pcs Year(s) : 2012 Location : EUROPE (Western and Northern)

Price : On request

OXFORD PLASMALAB 100 ICP ETCHER consisting of: - Manufacturer: Oxford Instruments - Model: Plasmalab System 10 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

KLA-TENCOR CANDELA CS920 SURFACE ANALYZER consisting of: Model: Candela CS920 Vintage: 2017 Surface Analyzing Year(s) : 2017 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Inspection microscope with reflected and transmitted illumination Reflected and transmitted light 5x/10x/20x/5 Location : EUROPE (Western and Northern)

Price : On request

Wafer Size 300 mm Fab Section Test General Product Information Vendor Supplier TEL Model P12XL Prober Vintage Year(s) : 2002 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Wafer Size 300 mm Fab Section Lithography General Product Information Vendor Supplier TEL Model LITHIUS Vinta Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Wafer Size 200 mm Fab Section Test General Product Information Vendor Supplier TEL Model P8 Vintage 1995 Asse Year(s) : 1995 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Placement Machine Model: NXTIIC M6 DOM: 2014 Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

KLA-TENCOR 2139 SURFACE INSPECTION SYSTEM consisting of: - Model: 2139 - Configured for 200mm Dual Open Ca Location : AMERICA North (USA-Canada-Mexico)

Price : On request

KLA-TENCOR PROMETRIX RS100 FOUR POINT PROBE RESISTIVITY MAPPING SYSTEM consisting of: - Model: Prometrix RS10 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

KLA-TENCOR HRP-240 PROFILER consisting of: - Model: HRP-240 - Automated Surface Profiler - WAFER SIZE : 150mm Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Inspection: Surface profiler/Contour film thickness gauge Location : ASIA (North East)

Price : On request

Inspection: Wafer Location : ASIA (North East)

Price : On request

Inspection: Profilometer Location : ASIA (North East)

Price : On request

Wafer Size 300 mm Fab Section Lithography General Product Information Vendor Supplier TEL Model LITHIUS Vinta Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Wafer Size 200 mm Fab Section Etch General Product Information Vendor Supplier TOKYO ELECTRON LTD Model U2E-8 Year(s) : 1997 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Wafer Size 300 mm Fab Section Etch General Product Information Vendor Supplier LAM Model 2300 Exelan Flex Vin Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)

Price : On request