Used Metrology and inspection equipment
1,121 resultsKLA-TENCOR SURFSCAN SP1 DLS UNPATTERNED SURFACE INSPECTION SYSTEM consisting of: - Model: SP1 DLS with 300mm S Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsKLA-TENCOR ASET F5x THIN FILM MEASUREMENT SYSTEM consisting of: - Model: ASET F5x - Configured for 300mm Wafe Location : AMERICA North (USA-Canada-Mexico)
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More detailsOEM Name: Nanotronics Nanotronics Nspec PS Defect Inspection System consisting of: - Model: Nspec PS - Alum Location : AMERICA North (USA-Canada-Mexico)
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More detailsDOM: 8/2022 Precision XY gantry. High-speed linear motors with closed loop high resolution linear encoders. A Year(s) : 2022 Location : AMERICA North (USA-Canada-Mexico)
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More detailsDOM: 12/19/2022 3D Vision - 80 Mpixel 3D system (16 cameras, 4 projectors): Distortion free 3D triangulation Year(s) : 2022 Location : AMERICA North (USA-Canada-Mexico)
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More details200mm As-is KLA / MicroSense UMA-C200-STR Thin Film Stress Measurement System consisting of: - Vintage: Appro Year(s) : 2019 Location : EUROPE (Western and Northern)
Price : On request
More detailsSuss MJB3 submicron mask aligner with 350w lamphouse and splitfield optics Splitfield microscope Leica objec Location : EUROPE (Western and Northern)
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More detailsMask aligner with vacuum contact, proximity or soft contact alignment modes. 365 to 400nm spectral range at Location : AMERICA North (USA-Canada-Mexico)
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More detailsMax KV: 160KV Operating system : Windows 10 Detector : Flat Panel Max tube power : 10W Tube NT500 Condition : Location : AMERICA North (USA-Canada-Mexico)
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More detailsDOM: 10/2020 Dage SW version V22.6.4 30-160kv / 20 Watt tube Oblique View: 70 Degree Resolution: 3MP Frame R Year(s) : 2020 Location : AMERICA North (USA-Canada-Mexico)
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More detailsFor 200mm & 300mm Patterned & Unpatterned Wafers Brightfield/Darkfield Optics 2X, 3.5X, 5X & 10X Objectives 3 Year(s) : 2016 Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand: AOI Systems Limited Type: In-line AOI Automated Optical Inspection The economic realities of quality c Location : AMERICA North (USA-Canada-Mexico)
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More detailsOP2600DUVI, 200mm, s/n: 6454 Year(s) : 1997 Location : AMERICA North (USA-Canada-Mexico)
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More detailsOP3260I, 200mm, s/n: 6678 Year(s) : 1998 Location : AMERICA North (USA-Canada-Mexico)
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More detailsScanning Electron Microscopes Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)
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More detailsEDR 5210, 300mm, s/n: 5040135 Year(s) : 2010 Location : AMERICA North (USA-Canada-Mexico)
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More detailsFor 200mm & 300mm Patterned & Unpatterned Wafers Brightfield/Darkfield Optics 2X, 3.5X, 5X & 10X Objectives 35 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsFor 150mm & 200mm Patterned & Unpatterned Wafers For GaN & GaAs on Sapphire & Silicon Wafers Brightfield/Dark Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsAutomated Optical Inspection System Brand Pemtron Year(s) : 2020 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsHigh-Tech Science High-performance fluorescent X-ray thickness gauge [Main specifications] ・X-ray tube: Tub Year(s) : 2013 Location : ASIA (North East)
Price : On request
More detailsFor 200mm Patterned Wafers on Film Frames Brightfield/Darkfield Optics 2X, 5X, 10X & 20X Objectives 35X LWD Re Year(s) : 2022 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsBrightfield Defect Inspection Tool Cassette to Cassette YES Condition Excellent 0.25µ, 0.39µ, 0.62µ Spot Si Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsWafer Size Range Minimum 300 mm Maximum 300 mm Set Size 300 mm Illumination Source Type Multi-wave Year(s) : 2016 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsVendor Supplier RIGAKU Model TXRF-V300 Vintage 2007 Software Version 1.55 CIM SEC/GEM Process TXRF measurement Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsOAI Model 806 MBA NUV 4" Mask Aligner is a four-camera, manual, optical backside mask aligner system that is d Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.