Used Metrology and inspection equipment
1,129 resultsMicroscope Year(s) : 2010 Location : ASIA (North East)
Price : On request
More detailsMicroscope Year(s) : 2012 Location : ASIA (North East)
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More detailsMask & Wafer Inspection Working condition Year(s) : 2008 Location : EUROPE (Western and Northern)
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More detailsEye Piece: SWH10 x /26.5 Objective lens: MpanFLN x5 x10 x20 Working Condition Year(s) : 2015 Location : EUROPE (Western and Northern)
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More detailsVintage: 01.05.1997 Cassette to Cassette Handling of 200mm Wafers Non-Contact Wafer Pre-Alignment Trinocular H Year(s) : 1997 Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer Inspection Microscope •5 Position Turret with Motorized Rotation •CF Plan 2.5X Bright/Darkfield Object Location : AMERICA North (USA-Canada-Mexico)
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More detailsCMP metrology system Version: 300 mm -De-installed, warehoused. Can be inspected by appointment. -Has CE mark Location : AMERICA North (USA-Canada-Mexico)
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More detailsWAFER SIZE 150mm Professionally Deinstalled, skidded in storage Working condition prior to deinstall Year(s) : 2004 Location : EUROPE (Western and Northern)
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More detailsEllipsometer for CD and thin film measurements Version: 300 mm Vintage: 01.01.2018 Nova Instruments T600 Multi Year(s) : 2018 Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer Inspection Microscope with autoloader Version: 100 MM AND 150 mm In good working condition Has CE safety Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicroscope Year(s) : 2005 Location : ASIA (North East)
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More detailsTransmission electron microscope (TEM) Year(s) : 2012 Location : ASIA (North East)
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More detailsWafer Inspection Microscope Version: 150 mm Microscope Type Upright Microscope Configuration Brightfield Ill Location : AMERICA North (USA-Canada-Mexico)
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More detailsInspection: Surface Defect/4-6in Model Candela8720 Year(s) : 2017 Location : ASIA (North East)
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More detailsMicroscope Model Fusion Year(s) : 2008 Location : ASIA (North East)
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More detailsOlympus MX-80 Wafer Inspection Microscope Motorized Stage for up to 300mm Wafers Bright/Darkfield Optics: 5X, Location : AMERICA North (USA-Canada-Mexico)
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More detailsAOI System Location : AMERICA North (USA-Canada-Mexico)
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More detailsmask aligner exposes up to 3″ wafers Includes split field optics Location : AMERICA North (USA-Canada-Mexico)
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More detailsMa 6 mask aligner upgraded 1000 watt power supply 1 micron resolution on 6″ wafers Location : AMERICA North (USA-Canada-Mexico)
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More detailsMetal Film thickness measurement Version: 300mm Location : AMERICA North (USA-Canada-Mexico)
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More detailsMP200 double path tool non copper tool; double path tool delay stage; 6 inch chuck Cooling Water Required Min Year(s) : 2006 Location : EUROPE (Western and Northern)
Price : On request
More detailsDOM: 11/2016 OS: Windows 7 5 Cameras, 12um pixel size Year(s) : 2016 Location : AMERICA North (USA-Canada-Mexico)
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More detailsProgrammable pulse periodic reverse power supply, 20 volts peak, 30 amp maximum DC, 100amp peak pulse, DynaNet Location : AMERICA North (USA-Canada-Mexico)
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More detailsUnpatterned Surface Inspection System Location : AMERICA North (USA-Canada-Mexico)
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More detailsKLA ADE equipment Metrology Location : AMERICA North (USA-Canada-Mexico)
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More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.