Used Metrology and inspection equipment
1,131 resultsInspection: AOI Model BF18D-S Year(s) : 2004 Location : ASIA (North East)
Price : On request
More detailsInspection: AOI Year(s) : 2003 Location : ASIA (North East)
Price : On request
More detailsInspection: 3D X-ray/LtoR Model VT-X750 Year(s) : 2018 Location : ASIA (North East)
Price : On request
More detailsInspection/2D Model PA-500TL Year(s) : 2011 Location : ASIA (North East)
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More detailsAtomic Force Microscope Accessories Stage Controller: NanoScope Model 5000C-1 Scanning Probe Microscope Con Location : AMERICA North (USA-Canada-Mexico)
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More detailsBPSG Processing Power Requirements 380 V 63.0 A 50/60 Hz 3 Phase CE Marked YES Condition Excell Year(s) : 1999 Location : EUROPE (Western and Northern)
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More detailsSpinprocessor Typ 10 Year(s) : 2004 Location : EUROPE (Western and Northern)
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More detailsMetrology Equipment Year(s) : 2001 Location : EUROPE (Western and Northern)
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More detailsGE Phoenix Nanome|x 180 PCBA X-ray system 180KVA Dual Detector : has both Image intensifier and flat panel de Location : AMERICA North (USA-Canada-Mexico)
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More detailsVitrox Advanced 3D X-ray Inspection Machine Model: V810i Series: S2EX DOM: 12/18/2019 Maximum board Year(s) : 2019 Location : AMERICA North (USA-Canada-Mexico)
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More detailsTEL Precio Wafer Prober Tri-Temp with Chiller Dual FOUP Handlers Wafer Size Range Minimum 200 mm Maxim Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer Size 6" Tool's Condition Excellent Nikon Eclips L200 - Wafer size : up to 8" - Objectives : 5X, 10X, 2 Location : ASIA (North East)
Price : On request
More detailsParmi SPI Tabletop Solder Paste Inspector Model Number: 50T Notes: • Measuring principle: Laser optical trian Location : AMERICA North (USA-Canada-Mexico)
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More detailsDigital Microscope Model Number: VHX-5000 • Controller Unit: VHX-5000 • Camera Unit: VHX-5020 • RZ Lens: VH-Z2 Location : AMERICA North (USA-Canada-Mexico)
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More detailsAutomated Optical Inspection Machine. Input: 200-240 50/60 Hz. Single phase. Good Working Condition. Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)
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More detailsEquipped with a Die. The Pneumatic MARK V cuts and forms component leads to a variety of configurations at hig Location : AMERICA North (USA-Canada-Mexico)
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More detailsYesTech X-Ray Inspection System YTX-3000_ ID 112791 VOLTAGE 120VAC, 1500W MAX Vintage 2003 130KVA Sealed Tube Location : AMERICA North (USA-Canada-Mexico)
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More detailsPlease visit our website for updated information at www.allwin21.com Updated Brochure in2024： https://allwin Year(s) : 2024 Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer probe process analysis Automated macro defect inspection Quick, reliable 2D bump inspection Advanced pro Location : EUROPE (Western and Northern)
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More details- Alignment System MA150e TSA - PC -Aut. Adjustment ( Autoalignment System) Cognex 8100 ( Patmex ) TSA - Lamph Location : EUROPE (Western and Northern)
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More detailsDescription: 1 pc. Stereo Microscope Leica 165C Reflected light and transmitted light mi Location : EUROPE (Western and Northern)
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More detailsGrid electron microscope Resolution: 1,8 nm at 1kV or 0,5 nm at 30kV Magnification: Low magnification mode: 6 Year(s) : 2001 Location : EUROPE (Western and Northern)
Price : On request
More detailsDescription: Inspection microscopes microscopes microscopes microscopes Longdescription: Inspection microsc Location : EUROPE (Western and Northern)
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More detailsdescription: - the laser is alive it is built for 110V, but we have a generator Year(s) : 2000 Location : EUROPE (Western and Northern)
Price : On request
More detailsTemperature Shock Chamber Condition: very good Year(s) : 101252 Location : EUROPE (Western and Northern)
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More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.