Used Metrology and inspection equipment
1,232 resultsFoup purge station Year(s) : 2015 Location : United States (USA)
Price : On request
More detailsG3 Lite, 300mm, S/N W3041 Tool ID: YSEM732 Year(s) : 2007 Location : United States (USA)
Price : On request
More detailsOptima MD, 300mm, s/n: 083011 Medium Current Implant Year(s) : 2006 Location : United States (USA)
Price : On request
More details200mm Tool ID: HFCLN-01 Location : United States (USA)
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More details7900-L, s/n: Z3D-7900-0412-0028, 300 mm Tool ID: ICD2900 Year(s) : 2012 Location : United States (USA)
Price : On request
More detailseScan 500, sn: ML07114, Defect Review, 300mm Tool ID: SEI2703 Year(s) : 2014 Location : United States (USA)
Price : On request
More details300mm, S/N PN00453 Tool ID: PROMOS_1158/082 Year(s) : 2004 Location : United States (USA)
Price : On request
More detailsBrightfield inspection Location : United States (USA)
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More detailseS32 is a top-of-the-line mask and wafer inspection equipment that is designed to meet the most stringent qua Year(s) : 2006 Location : EUROPE (Western and Northern)
Price : On request
More detailsCurrently Under KLA Service Contract. Location : EUROPE (Western and Northern)
Price : On request
More detailsas is where is in fab running Year(s) : 2006 Location : EUROPE (Western and Northern)
Price : On request
More detailsAligner/Mask Year(s) : 2013 Location : ASIA (North East)
Price : On request
More detailsMania Argos 850 YOM 05/2003 Fully functional Year(s) : 2003 Location : EUROPE (Western and Northern)
Price : On request
More detailsVintage : 2004. HDDs included, please see the photos. Year(s) : 2004 Location : EUROPE (Western and Northern)
Price : On request
More detailsWAFER SIZE 200mm Location : EUROPE (Western and Northern)
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More detailsModel: SEM Vision cX OEM: AMAT Accessory: 1 Baking Box, 1 User Manual Condition at Time of Shutdown: Operated Year(s) : 2001 Location : EUROPE (Western and Northern)
Price : On request
More detailsKLA Tencor Altair 8935 Wafer Inspection System consisting of: - Multiple Wafer Size Configurations Availabl Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsSEM / FIB Year(s) : 2007 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsInspection: Profilometer Year(s) : 1999 Location : ASIA (North East)
Price : On request
More detailsdouble rail; CPK2.6; 30 type camera--4pcs; nozzle--48pcs Year(s) : 2012 Location : EUROPE (Western and Northern)
Price : On request
More detailsKLA-TENCOR CANDELA CS920 SURFACE ANALYZER consisting of: Model: Candela CS920 Vintage: 2017 Surface Analyzing Year(s) : 2017 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsInspection microscope with reflected and transmitted illumination Reflected and transmitted light 5x/10x/20x/5 Location : EUROPE (Western and Northern)
Price : On request
More detailsKLA-TENCOR 2139 SURFACE INSPECTION SYSTEM consisting of: - Model: 2139 - Configured for 200mm Dual Open Ca Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsKLA-TENCOR PROMETRIX RS100 FOUR POINT PROBE RESISTIVITY MAPPING SYSTEM consisting of: - Model: Prometrix RS10 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsKLA-TENCOR HRP-240 PROFILER consisting of: - Model: HRP-240 - Automated Surface Profiler - WAFER SIZE : 150mm Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.