Used Metrology and inspection equipment
1,121 resultsSAKI BF-10D In-line Dual Lane High Resolution and High Speed AOI Scanning time for M size (330x250mm) PCB is Location : EUROPE (Western and Northern)
Price : On request
More detailsSAKI BF-FRONTIER II In-line 2D AOI Max PCB size is 330x250mm for BF-Planet-XII, 500x460mm for BF-FrontierII, Location : EUROPE (Western and Northern)
Price : On request
More detailsSAKI BF-PLANET XII In-line 2D AOI Max PCB size is 330x250mm for BF-Planet-XII, 500x460mm for BF-FrontierII, 8 Location : EUROPE (Western and Northern)
Price : On request
More detailsSAKI BF-3Di 3D height data to be by directly reading sample and components height to analyze assembly conditi Location : EUROPE (Western and Northern)
Price : On request
More detailsSAKI BF-10BT The offline inspection machine series can directly contribute to improve line productivity with Location : EUROPE (Western and Northern)
Price : On request
More detailsSAKI Sirius 2D Systems BF-Sirius The offline inspection machine series can directly contribute to improve li Location : EUROPE (Western and Northern)
Price : On request
More detailsSAKI BF-Comet10/18 The offline inspection machine series can directly contribute to improve line productivity Location : EUROPE (Western and Northern)
Price : On request
More detailsVision Engineering Mantis Mk1 System 2 Lens systems X4 and X8/X10 Magnification Location : EUROPE (Western and Northern)
Price : On request
More detailsThe IR Rework system is broken down into four basic operational modules: I. IR 550 Selective Reflow module II Year(s) : 2008 Location : EUROPE (Western and Northern)
Price : On request
More detailsYestech Benchtop Optical Inspection Quick Set up Supplied fully working & Tested Colour Camera Max. Board Siz Location : EUROPE (Western and Northern)
Price : On request
More detailsused Mitutoyo QS200Z3r Quickscope It has not been tested recently We are not sure it if works and it does not Year(s) : 2006 Location : ASIA (North East)
Price : On request
More details- 6” single and double orientation flat holders - Cursor and line profile measuring method - 0.1um to 10um mea Year(s) : 1996 Location : EUROPE (Western and Northern)
Price : On request
More details- LDS 3000 M/Smif, 6 and 8" capable - 1x smif Indexer INX2150 (6") and 1x smif Indexer INX2200 (8") - UV-optio Year(s) : 2006 Location : EUROPE (Western and Northern)
Price : On request
More detailsVanguard automation platform including: - Clean room compatible stainless steel cabinetry - Dual SMIF I/O for Year(s) : 1999 Location : EUROPE (Western and Northern)
Price : On request
More detailsManufacturer: JEOL Model: JEM 2010 Transmission electron microscope (TEM) Upgraded TEM operation system to JE Year(s) : 1994 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details<b>1 x SEMIPROBE Model: SA-8</b> Wafer Size: 8" Semiautomatic prober, 8". Chuck stage X-Y movement: Travel: Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsPrometrix FT-600 Wafer Film Thickness Probe System System includes: - Prometrix FT-600 Film Thickness Prob Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsCarl Zeiss Axiotech 100 HD Trinocular Wafer Inspection Microscope System System includes: Carl Zeiss Axiot Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsVeeco Wyko HD-3300 Head Measurement Optical Profiler 3D Wafer Metrology System System includes: Veeco Wyko Year(s) : 1999 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details•Manufactured by: Nicolet Imagine Systems •Supply voltage: 203-240 vac •2 wire with ground •Supply current: 25 Year(s) : 1999 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsFocused Ion Beam (FIB) system. Location : United States (USA)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.