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Used Metrology and inspection equipment

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1

Wafer Specification Wafer Size: 200MM Wafer Shape: SNNF (Semi Notch No Flat) Wafer : 6”, 8” or 12” Location : AMERICA North (USA-Canada-Mexico)

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AJA International Model # ORION8 EQUIPMENT TYPE: RF Sputter Deposition System MANUFACTURER: AJA International Location : AMERICA North (USA-Canada-Mexico)

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ECI Technology Serial number: AA 0508101 POWER RATING 100-127 AC, 50/60 Hz 20A Largest loads 5A Convenient ou Location : AMERICA North (USA-Canada-Mexico)

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Standard recipe600/601 for AI etching: Etch rate: 800 nm/min, Photoresist etch rate:400nm/min, Standard recipe Location : AMERICA North (USA-Canada-Mexico)

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Dektak Model 8000 Location : AMERICA North (USA-Canada-Mexico)

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Brand: FUTEK FUTEK Furnace Location : AMERICA North (USA-Canada-Mexico)

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SAKI BF-10Z n-line 2D AOI Max PCB size is 330x250mm for BF-Planet-XII, 500x460mm for BF-FrontierII, 870x686mm Location : EUROPE (Western and Northern)

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SAKI BF TRISTAR II In-line/Off-line Simultaneous Double-sided AOI Suitable for the final inspection such as a Location : EUROPE (Western and Northern)

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SAKI BF-10D In-line Dual Lane High Resolution and High Speed AOI Scanning time for M size (330x250mm) PCB is Location : EUROPE (Western and Northern)

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SAKI BF-FRONTIER II In-line 2D AOI Max PCB size is 330x250mm for BF-Planet-XII, 500x460mm for BF-FrontierII, Location : EUROPE (Western and Northern)

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SAKI BF-PLANET XII In-line 2D AOI Max PCB size is 330x250mm for BF-Planet-XII, 500x460mm for BF-FrontierII, 8 Location : EUROPE (Western and Northern)

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SAKI BF-3Di 3D height data to be by directly reading sample and components height to analyze assembly conditi Location : EUROPE (Western and Northern)

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SAKI BF-10BT The offline inspection machine series can directly contribute to improve line productivity with Location : EUROPE (Western and Northern)

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SAKI Sirius 2D Systems BF-Sirius The offline inspection machine series can directly contribute to improve li Location : EUROPE (Western and Northern)

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SAKI BF-Comet10/18 The offline inspection machine series can directly contribute to improve line productivity Location : EUROPE (Western and Northern)

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Vision Engineering Mantis Mk1 System 2 Lens systems X4 and X8/X10 Magnification Location : EUROPE (Western and Northern)

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The IR Rework system is broken down into four basic operational modules: I. IR 550 Selective Reflow module II Year(s) : 2008 Location : EUROPE (Western and Northern)

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Yestech Benchtop Optical Inspection Quick Set up Supplied fully working & Tested Colour Camera Max. Board Siz Location : EUROPE (Western and Northern)

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used Mitutoyo QS200Z3r Quickscope It has not been tested recently We are not sure it if works and it does not Year(s) : 2006 Location : ASIA (North East)

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- 6” single and double orientation flat holders - Cursor and line profile measuring method - 0.1um to 10um mea Year(s) : 1996 Location : EUROPE (Western and Northern)

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- LDS 3000 M/Smif, 6 and 8" capable - 1x smif Indexer INX2150 (6") and 1x smif Indexer INX2200 (8") - UV-optio Year(s) : 2006 Location : EUROPE (Western and Northern)

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Vanguard automation platform including: - Clean room compatible stainless steel cabinetry - Dual SMIF I/O for Year(s) : 1999 Location : EUROPE (Western and Northern)

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Manufacturer: JEOL Model: JEM 2010 Transmission electron microscope (TEM) Upgraded TEM operation system to JE Year(s) : 1994 Location : AMERICA North (USA-Canada-Mexico)

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<b>1 x SEMIPROBE Model: SA-8</b> Wafer Size: 8" Semiautomatic prober, 8". Chuck stage X-Y movement: Travel: Location : AMERICA North (USA-Canada-Mexico)

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Prometrix FT-600 Wafer Film Thickness Probe System System includes: - Prometrix FT-600 Film Thickness Prob Location : AMERICA North (USA-Canada-Mexico)

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You can find used Metrology and inspection equipment on Wotol

The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.

The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XS5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.

HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors. 

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