Used Metrology and inspection equipment
1,230 resultsMirtec MV3 2D Desktop AOI System Year(s) : 2013 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsViTech 5K 3D Inline AOI Machine Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsMirtec MV3 3D Stand Alone AOI System Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details200mm Description Non working/running rvsi inspection set up for 267mm TSV. Missing robot, ocr cameras Year(s) : 2003 Location : EUROPE (Western and Northern)
Price : On request
More detailsProber: Fullauto Year(s) : 2005 Location : ASIA (North East)
Price : On request
More detailsMicroscope Year(s) : 2002 Location : ASIA (North East)
Price : On request
More detailsSurface Roughness and Contour Measuring Instrument Location : ASIA (North East)
Price : On request
More detailsMask aligner up to 6inch wafer Year(s) : 2009 Location : ASIA (North East)
Price : On request
More detailsWafer Size 8" Tool's Condition Excellent Capable 4" to 8" Wafer Optical Console - Michelson Interferometer - Year(s) : 1994 Location : ASIA (North East)
Price : On request
More details・Pump: Serial dual piston Flow rate range: 0.001 to 10.0 mL/ min - Pressure range: 0 to 41 MPa (0 to 6000 psi Location : ASIA (North East)
Price : On request
More details• Optical magnification: 0.5x to 7.5x (9.33×7 to 0.622×0.467mm) • Stroke: X axis 300mm × Y axis 200mm × Z axis Location : ASIA (North East)
Price : On request
More details• Observation method: Transmitted light, fluorescent light • Total magnification: 40x, 100x, 200x, 400x, 1000x Location : ASIA (North East)
Price : On request
More detailsOther: X-Ray system Year(s) : 2007 Location : ASIA (North East)
Price : On request
More detailschem: CO2 Mixer for water resistivity control Location : ASIA (North East)
Price : On request
More detailscmp: Surface Planer Year(s) : 2014 Location : ASIA (North East)
Price : On request
More detailsVintage : OCT 2013 14" x 14" Work Area 208V 1 Phase 50/60Hz Specifications ( See Details above for installed Year(s) : 2013 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsThe Keyence VHX-600E Digital Microscope is an advanced visible light microscope with the following advantages Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsCascade Microtech Summit 12000 200mm Prober with Attoguard Microchamber and -65°C to 200°C Shielded Chuck. C Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsSold in good working condition Refurbished WaferMark Sigmaclean Laser Marking Machine Vintage:2001 With Ultra Year(s) : 2001 Location : EUROPE (Western and Northern)
Price : On request
More detailsThis JEOL JASM-6200 Atmospheric Scanning Electron Microscope Clairescope was removed from a university lab wh Year(s) : 1993 Location : EUROPE (Western and Northern)
Price : On request
More detailsInverted Fluorescence Motorised Microscope Model Observer.Z1 Location : EUROPE (Western and Northern)
Price : On request
More detailsThis Jeol JSM-5910LV SEM Scanning Electron Microscope was removed from a university lab where it was surplus Location : EUROPE (Western and Northern)
Price : On request
More detailsProber/12in Year(s) : 2005 Location : ASIA (North East)
Price : On request
More detailsSCARA Robot/YK-XG Year(s) : 2019 Location : ASIA (North East)
Price : On request
More detailsSignatone CM100 manual prober Analytical probe station with submicron resolution Manual control of wafer stage Location : EUROPE (Western and Northern)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.