Used Metrology and inspection equipment
1,151 resultsWafer Size 300 mm Fab Section Metrology General Product Information Vendor Supplier KLA Model Shelby LD10 Vin Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsWafer Size 300 mm Fab Section Metrology General Product Information Vendor Supplier COMPLAIN Model Spectra Fi Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)
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More detailsDefect Inspection system Model INS 3000 Sold As Is Location : EUROPE (Western and Northern)
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More detailsPA200 200 mm Wafer Prober with Laser Trimmer. Unit sold for parts. 200mm temperature controlled chuck without Location : AMERICA North (USA-Canada-Mexico)
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More detailsAligner Year(s) : 2010 Location : ASIA (North East)
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More detailsWafer Size 300 mm Fab Section Metrology General Product Information Vendor Supplier COMPLAIN Model Spectra Fi Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer Size 200 mm Fab Section Metrology General Product Information Vendor Supplier KLA Model OP5240I Vintage Year(s) : 1999 Location : AMERICA North (USA-Canada-Mexico)
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More detailsAsset Description Focus Ion Beam Mill Software Version Windows Process Focus Ion Beam Mill Hardware Confgurat Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)
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More details4 mega camera 4way projection 15um pixel resolution Review station included Year(s) : 2013 Location : EUROPE (Western and Northern)
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More detailsOpen tube - 160kV x-ray system High magnification nano focus tube Flat panel detector Machine is CT ready a Location : AMERICA North (USA-Canada-Mexico)
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More detailsBoard Inspection Model 6055-II AOI Year(s) : 2005 Location : EUROPE (Western and Northern)
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More detailsBrand: AOI Systems Limited Type: In-line AOI Automated Optical Inspection The economic realities of quality c Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer Size 300 mm Fab Section Lab General Product Information Vendor Supplier FEI Model FEI ExSolve CLM next Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)
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More detailsStepper/6in Location : ASIA (North East)
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More detailsWafer Size 300 mm Fab Section Defect Detection General Product Information Vendor Supplier KLA Model 2835 Bri Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)
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More details14″ Max Board Width 208 VAC Dimensions: 44″ W x 63″ D x 65″ Tall Max board width (mm): 355 Max board length (m Location : EUROPE (Western and Northern)
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More detailsWorking condition Vi Technology Model Vi 3K2 Vintage 2006 Year(s) : 2006 Location : EUROPE (Western and Northern)
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More detailsBoard Inspection Test Model S3054QS Year(s) : 2004 Location : EUROPE (Western and Northern)
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More details4mega camera 8 way projection includes Review station computer. - Optional (not included) : Offline Teaching Year(s) : 2013 Location : EUROPE (Western and Northern)
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More detailsWafer Size 300 mm Fab Section Failure Analysis Tool Available Date 2024-08-27 General Product Information Vin Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer Size 300 mm Fab Section Defect Detection General Product Information Vendor Supplier AMAT Model UVision Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)
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More details200mm PCB Inspection Microscope Observation method Bright field, dark field Stage stroke X direction: 200mm Location : ASIA (North East)
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More detailsWafer Size 300 mm Fab Section Lab General Product Information Vendor Supplier FEI Model FEI ExSolve CLM Next Year(s) : 2016 Location : AMERICA North (USA-Canada-Mexico)
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More details[Main specifications] SEM ・Magnification: Secondary electron image (×10~60,000), backscattered electron image Location : ASIA (North East)
Price : On request
More detailsStepper: ArF scanner/8in. Year(s) : 2003, 2004 Location : ASIA (North East)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.