Jeol JCM-6000PLUS (with EDX)

[Main specifications]
SEM
・Magnification: Secondary electron image (×10~60,000),
backscattered electron image (×10~30,000)
・Accelerating voltage: Secondary electron image
(select from 5, 10, 15kV), backscattered electron image
(select from 10, 15kV)
・Electron gun: Small electron gun with integrated filament and
Wehnelt grid
・Filament current: Standard, high brightness
・Bias voltage: Auto bias method
(linked to accelerating voltage and filament current)
・Detector: Secondary electron detector (E.T. detector).
Backscattered electron detector (semiconductor detector)
・Automatic functions: Alignment, focus, stigma, contrast, brightness
・Maximum sample size: Size up to 70mmΦ, height Maximum 50mm
・PC related: 1 PC unit, 1 monitor
・Power supply: Single-phase AC100V 50/60Hz 700VA
・Dimensions and weight: (Tube unit) W325×D490×H430mm, approx. 50kg
(Power supply box) W200×D480×H270mm, approx. 10kg
(Rotary pump) W288.5×D127×H237mm, approx. 9kg

EDS
・Model: JED-2300
・Analysis limit: Maximum 32 elements

Sample coater
Model: DII-29020SCTR
Vacuum level: up to 4Pa
Sample chamber size: inner diameter 86mm x depth 100mm, hard glass
Target size: inner diameter 49.5mm x thickness 0.1mm
Target electrode: diameter 20mm
Sputtering time: 0.5 minutes, 1 minute, 2 minutes
Target: gold
Power supply: AC90-120V 50/60Hz 500VA

[Equipment status]
Instruction manual included
Observation materials shown in the photo are not included.
Startup, vacuuming, high pressure ON, SEM image confirmation,
EDS analysis operation confirmation, etc.
have been completed without any problems.