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Used Metrology and inspection equipment

1,160 results
1

200mm, s/n: PTG00690EX Year(s) : 2000 Location : AMERICA North (USA-Canada-Mexico)

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300mm, s/n: 530N00151A FEOL CLEAN Year(s) : 2013 Location : AMERICA North (USA-Canada-Mexico)

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Veeco Wyko NT3300 Profiler consisting of: - Model: NT3300 - Computer & Monitor - Keyboard & Mouse - Objective Location : AMERICA North (USA-Canada-Mexico)

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KLA-TENCOR SURFSCAN 6420 PARTICLE INSPECTION SYSTEM consisting of: Model: Surfscan 6420 Particle inspection sy Location : AMERICA North (USA-Canada-Mexico)

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Vintage 2014 Condition: excellent CE marked Year(s) : 2014 Location : EUROPE (Western and Northern)

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Semiprobe wafer prober mounted on Newport table Inspects diced wafers mounted on film frames Wafer stage with Location : EUROPE (Western and Northern)

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Equipment Make: KLA-Tencor Equipment Model: SP 1-Classic Type: Inspection Machine Wafer Size: 6" to 8" Equipme Location : EUROPE (Western and Northern)

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300mm, s/n: 205935 Xray Diffractometers Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)

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Raider ECD310 Year(s) : 2009 Location : AMERICA North (USA-Canada-Mexico)

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Wafer Size 300 mm Fab Section Metrology General Product Information Vendor Supplier KLA Model Shelby LD10 Vin Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)

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Wafer Size 300 mm Fab Section Metrology General Product Information Vendor Supplier COMPLAIN Model Spectra Fi Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)

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Defect Inspection system Model INS 3000 Sold As Is Location : EUROPE (Western and Northern)

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PA200 200 mm Wafer Prober with Laser Trimmer. Unit sold for parts. 200mm temperature controlled chuck without Location : AMERICA North (USA-Canada-Mexico)

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Aligner Year(s) : 2010 Location : ASIA (North East)

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Wafer Size 300 mm Fab Section Metrology General Product Information Vendor Supplier COMPLAIN Model Spectra Fi Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)

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Wafer Size 200 mm Fab Section Metrology General Product Information Vendor Supplier KLA Model OP5240I Vintage Year(s) : 1999 Location : AMERICA North (USA-Canada-Mexico)

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Asset Description Focus Ion Beam Mill Software Version Windows Process Focus Ion Beam Mill Hardware Confgurat Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)

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4 mega camera 4way projection 15um pixel resolution Review station included Year(s) : 2013 Location : EUROPE (Western and Northern)

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Open tube - 160kV x-ray system High magnification nano focus tube Flat panel detector Machine is CT ready a Location : AMERICA North (USA-Canada-Mexico)

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Board Inspection Model 6055-II AOI Year(s) : 2005 Location : EUROPE (Western and Northern)

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Brand: AOI Systems Limited Type: In-line AOI Automated Optical Inspection The economic realities of quality c Location : AMERICA North (USA-Canada-Mexico)

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Wafer Size 300 mm Fab Section Lab General Product Information Vendor Supplier FEI Model FEI ExSolve CLM next Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)

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Stepper/6in Location : ASIA (North East)

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Wafer Size 300 mm Fab Section Defect Detection General Product Information Vendor Supplier KLA Model 2835 Bri Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)

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14″ Max Board Width 208 VAC Dimensions: 44″ W x 63″ D x 65″ Tall Max board width (mm): 355 Max board length (m Location : EUROPE (Western and Northern)

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You can find used Metrology and inspection equipment on Wotol

The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.

The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XS5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.

HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors. 

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