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Used Semiconductor Equipment

3,427 results
1

FSICL MECURRY PROCESS Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)

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TRF6 HIMS-A01-T RETICLE MACRO INSPECTION TOOL(EVAL TOOL) (former LRIS-02) Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)

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1

KLA AITXUV, 300mm, s/n: UV1005R Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)

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PRI STOCKER Year(s) : 1999 Location : AMERICA North (USA-Canada-Mexico)

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LITV25-01 Scanner Laser is working Further details in attachments Year(s) : 2002 Location : EUROPE (Western and Northern)

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1

Lithography Model SK-3000-AVPO Year(s) : 2004 Location : EUROPE (Western and Northern)

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1

Wafer Size 300 mm Fab Section Metrology General Product Information Vendor Supplier KLA Singapore Model AITXU Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)

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1

Tool ID ASTEP-38 Tool Status Connected Wafer Size 200 mm Fab Section Lithography General Product Information Year(s) : 1997 Location : AMERICA North (USA-Canada-Mexico)

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1

Transaction Information Tool Status Disconnected Wafer Size 300 mm Fab Section Metrology General Product Info Year(s) : 2005 Location : AMERICA North (USA-Canada-Mexico)

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Transaction Information Tool ID YDFI735 Tool Status Disconnected Wafer Size 300 mm Fab Section Metrology Gene Year(s) : 2005 Location : AMERICA North (USA-Canada-Mexico)

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Transaction Information Tool ID EE-EME-03 Wafer Size 300 mm Fab Section Etch General Product Information Vend Year(s) : 2005 Location : AMERICA North (USA-Canada-Mexico)

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1

Semi-Automatic BGA Rework Station Nozzles Included Maximum Board Size: 18” x 22” (458mm x 560mm) Minimum Compo Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)

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1

KLA-TENCOR PROMETRIX RS55/TC FOUR POINT PROBE RESISTIVITY MAPPING SYSTEM consisting of: - Model: RS55/tc - Tem Location : AMERICA North (USA-Canada-Mexico)

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EVG EV501 WAFER BONDER consisting of: - Model: EVG 501 - Capable of thermo compression, fusion or anodic waf Location : AMERICA North (USA-Canada-Mexico)

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Tool ID YEBI731 (F7 YEBI703) Tool Status Connected Wafer Size 300 mm Fab Section Defect Detection General Pro Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)

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Tool ID ASMS707 Tool Status Disconnected Wafer Size 300 mm Fab Section Material Handling Tool Available Date 2 Year(s) : 2005 Location : AMERICA North (USA-Canada-Mexico)

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Wafer Size 200 mm Fab Section Diffusion General Product Information Vendor Supplier TEL Model TEL ALPHA 8S Vi Year(s) : 1996 Location : AMERICA North (USA-Canada-Mexico)

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1

Ion Milling System with Magnetron Sputtering Cathode. Research grade Ion milling system with a single Ion gun Location : AMERICA North (USA-Canada-Mexico)

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1

Configuration: left inline system; 8" wafer chuck; Nikon Type Reticle changer; 6" Reticle major hardware and Year(s) : 1996 Location : EUROPE (Western and Northern)

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WAFER SIZE 8,12 4 Chambers Year(s) : 2007 Location : EUROPE (Western and Northern)

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1

WAFER SIZE 8,12 1 chamber Year(s) : 2006 Location : EUROPE (Western and Northern)

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1

Tool ID AM-WSS-28 Wafer Size 300 mm Fab Section Material Handling Tool Available Date 2020-11-09 General Prod Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)

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1

Tool ID DFN-01 Tool Status Connected Wafer Size 200 mm Fab Section Diffusion General Product Information Vend Year(s) : 1994 Location : AMERICA North (USA-Canada-Mexico)

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1

Tool ID DF-OHT-02 Wafer Size 300 mm Fab Section Diffusion General Product Information Vendor Supplier TEL Mod Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)

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10

Only Sale of bundle of two devices, one fully functional, one for spare parts: 1. GST-150 SN 12077 (running) Location : EUROPE (Western and Northern)

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You can find used Semiconductor Equipment on Wotol

For second hand Semiconductor Equipment we have Wafer Equipment, Wafer Handler & Robots, CVD Equipment, Wet Bench, Lithography & Photoresist, Plasma Etcher / Asher, Dicer & Scriber, Grinding, Lapping & Polishing, Component Counters/Tapers, Dry Pump, Bonder, Metrology and inspection equipment. The main manufacturers for used Semiconductor Equipment are KLA-Tencor, Plasmatherm, AMAT, TEL, Disco, Karl Suss, Canon, Semitool, Hitachi, Nanometrics, Nikon, Applied Materials, Tegal, Varian.

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