Used Semiconductor Equipment

KLA-TENCOR SURFSCAN SP1 DLS UNPATTERNED SURFACE INSPECTION SYSTEM consisting of: - Model: SP1 DLS with 300mm S Location : AMERICA North (USA-Canada-Mexico)

Price : On request

KLA-TENCOR ASET F5x THIN FILM MEASUREMENT SYSTEM consisting of: - Model: ASET F5x - Configured for 300mm Wafe Location : AMERICA North (USA-Canada-Mexico)

Price : On request

OEM Name: Nanotronics Nanotronics Nspec PS Defect Inspection System consisting of: - Model: Nspec PS - Alum Location : AMERICA North (USA-Canada-Mexico)

Price : On request

panel size: 610 x 762mm (24 x 30"), Max. panel thickness: 0,8mm (0.032"), Machine Dimensions: 1760 x 1604 x 13 Year(s) : 1997 Location : EUROPE (Western and Northern)

Price : On request

200mm As-is KLA / MicroSense UMA-C200-STR Thin Film Stress Measurement System consisting of: - Vintage: Appro Year(s) : 2019 Location : EUROPE (Western and Northern)

Price : On request

PLASMATHERM ODYSSEY HDRF ASHER consisting of: - Model: Odyssey HDRF - Configured for 150mm wafers - 2 Chambers Location : EUROPE (Western and Northern)

Price : On request

Suss MJB3 submicron mask aligner with 350w lamphouse and splitfield optics Splitfield microscope Leica objec Location : EUROPE (Western and Northern)

Price : On request

Laminators Location : EUROPE (Western and Northern)

Price : On request

Detaping 6" thinwafer Wafer Size Range Minimum 200 mm Maximum 200 mm Set Size 200 mm Cassette to Ca Year(s) : 2006 Location : EUROPE (Western and Northern)

Price : On request

Max KV: 160KV Operating system : Windows 10 Detector : Flat Panel Max tube power : 10W Tube NT500 Condition : Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Wafer Size Range Minimum 200 mm Maximum 300 mm Set Size 300 mm Cassette to Cassette YES Wafer Hand Location : AMERICA North (USA-Canada-Mexico)

Price : On request

APCVD Version: 150 mm Year(s) : 1998 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Photoresist prime Version: 150 mm Year(s) : 2017 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

wafer Location : AMERICA North (USA-Canada-Mexico)

Price : On request

PLASMA CLEANER Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Applied Materials Raider Edge ECD Liftoff Tool 3ea Process Tanks 2ea Chemical Dispense Cabinets HCl, Dilute HF Year(s) : 2019 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

For 200mm & 300mm Patterned & Unpatterned Wafers Brightfield/Darkfield Optics 2X, 3.5X, 5X & 10X Objectives 35 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

For 150mm & 200mm Patterned & Unpatterned Wafers For GaN & GaAs on Sapphire & Silicon Wafers Brightfield/Dark Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Automated Optical Inspection System Brand Pemtron Year(s) : 2020 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Placement Machine (4) 12 nozzle heads Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

High-Tech Science High-performance fluorescent X-ray thickness gauge [Main specifications] ・X-ray tube: Tub Year(s) : 2013 Location : ASIA (North East)

Price : On request

Spin Etch Tool (8''tool) Condition Fair Exterior Dimensions Width 246.000 in (624.8 cm) Depth 109.0 Year(s) : 2006 Location : EUROPE (Western and Northern)

Price : On request

For 200mm Patterned Wafers on Film Frames Brightfield/Darkfield Optics 2X, 5X, 10X & 20X Objectives 35X LWD Re Year(s) : 2022 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Brightfield Defect Inspection Tool Cassette to Cassette YES Condition Excellent 0.25µ, 0.39µ, 0.62µ Spot Si Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Wafer Size Range Minimum 300 mm Maximum 300 mm Set Size 300 mm Illumination Source Type Multi-wave Year(s) : 2016 Location : AMERICA North (USA-Canada-Mexico)

Price : On request