Used Metrology and inspection equipment
1,223 resultsKLA-TENCOR SP1 TBI UNPATTERNED SURFACE INSPECTION SYSTEM consisting of: - Model: SP1 TBI - Up to 300mm Wafers Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsKLA-TENCOR 5200XP OVERLAY REGISTRATION SYSTEM consisting of: - Model: 5200XP - Overlay Registration(stepper al Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsNikon Microscope w/ Irvine Optical Ultrastation consisting of: - Irvine Optical Corp Model 3.E - Objectives: Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsManufacturer ICOS Model WI-2200 + MH 200 AVI_WI-2000+HM200 spec This system is used as a set. Vintage : 2009 Year(s) : 2009 Location : EUROPE (Western and Northern)
Price : On request
More detailsInspection System Parts Tool Location : EUROPE (Western and Northern)
Price : On request
More detailsWafer Inspection System 200mm Good Condition Just out from 200mm fab Location : EUROPE (Western and Northern)
Price : On request
More detailsDOM: 6/2016 Windows 7 Ultimate Year(s) : 2016 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsVintage : MAR 2013 Details 200-230V 3 Phase Specifications ( See Details above for installed options ) Nords Year(s) : 2013 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsTop Down Viewing Camera 120VAC 1500W Max Specifications ( See Details above for installed options ) YESTech’s Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsINLINE AOI SYSTEM MODEL VT S500-02 Year(s) : 2018 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsShadow Proof 3D Sensor 1D/2D Internal Reader Sigmalink Offline Review Software Vision 3D Program Inspection So Year(s) : 2020 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsContact Profilometer Version: 150 mm Year(s) : 2000 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsOperational Status: Installed / Running Wafer Sizes: 4"/100mm Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsModel: M360CHD Indexer assy config Horizontal CPU: G Location : EUROPE (Western and Northern)
Price : On request
More detailsTSK UF200H Wafer Prober Tool condition: Working Wafer Size 5-8" Location : EUROPE (Western and Northern)
Price : On request
More detailsWafer Inspection Microscope Model MIS200 Location : EUROPE (Western and Northern)
Price : On request
More detailsMeasurement: Film thickness/Fluorescent X-ray Model XDVN-W Location : ASIA (North East)
Price : On request
More detailsKLA SP3 Main Components - • Integrated Console • Bare Wafer Inspection Station • Equipment Front End Module (E Location : EUROPE (Western and Northern)
Price : On request
More detailsMP200 double path tool non copper tool; double path tool delay stage; 6 inch chuck Cooling Water Required Min Year(s) : 2002 Location : EUROPE (Western and Northern)
Price : On request
More detailsLeica INS3300 is the most advanced solution in the production control of 200 mm and 300 mm wafers. This compa Year(s) : 2003 Location : EUROPE (Western and Northern)
Price : On request
More detailsNikon Eclipse L200N Microscope consisting of: - Model: Eclipse L200N - L200N Stand with built in Transformer ( Year(s) : 2017 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsAutomatic Surface Inspection System Condition Very Good Power Requirements 200-240 V 50 Hz CE Marked YE Year(s) : 1996 Location : EUROPE (Western and Northern)
Price : On request
More detailsMicroscope Year(s) : 1997, 2000 Location : ASIA (North East)
Price : On request
More detailsMeasurement: Film thickness Year(s) : 2005 Location : ASIA (North East)
Price : On request
More detailsWorking condition before deinstall Location : EUROPE (Western and Northern)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.