Used Metrology and inspection equipment
1,242 resultsPower Requirements 230 V 16.0 A Condition Excellent Year(s) : 2007 Location : EUROPE (Western and Northern)
Price : On request
More detailsPower Requirements 240 V 13.0 A Condition Excellent Year(s) : 2014 Location : EUROPE (Western and Northern)
Price : On request
More detailsCyberoptics SE500-ULTRA SPI - 2015 #55076 DOM: March 2015 Win 7, V5.4.01283 software 510 x 510mm (20 x 20 in. Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsTube: NanoTech 160 kV / 20 W Transmissive tube. Microfocus source with submicron feature recognition Detect Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsKLA-TENCOR SURFSCAN SP2 UNPATTERNED SURFACE INSPECTION SYSTEM consisting of: - Model: SP2 with 200mm Open & Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsMetrology Model iHAWK Xtreme Year(s) : 2011 Location : EUROPE (Western and Northern)
Price : On request
More detailsHitachi WA200 FAB SMIFF interface Wide area scanning probe microscope Year(s) : 2001 Location : EUROPE (Western and Northern)
Price : On request
More detailsMetrology Model INS3300 Location : EUROPE (Western and Northern)
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More detailsVJ Electronix SRT Micra Rework Station Vintage: 9-2014 Software: Windows 7 Convection Top Site Heating SierraM Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsWafer Size 8" Vintage 1999-5 Year(s) : 1999 Location : ASIA (North East)
Price : On request
More detailsINSPECTA: 2400x1700 h 2100 CONTROL CABINET: 1400x700 h 1900 CHILLER: Location : EUROPE (Western and Northern)
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More details300mm, s/n: T239400 Wet Process Equipment Year(s) : 2009 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsWafer Size 8" Vintage 2010-6 Tool's Condition Excellent [ General Description ] Wafer Size : 2 ~8 inch Illum Year(s) : 2010 Location : ASIA (North East)
Price : On request
More detailsMicro-focus closed tube (130 kV) 3D-CT Method Resolution: 10, 15, 20, 25 or 30 μm (selectable to suit detected Year(s) : 2016 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsion: Implanter/4in Location : ASIA (North East)
Price : On request
More detailsChip: Mounter: LtoR Year(s) : 1999 Location : ASIA (North East)
Price : On request
More detailsBGA Rework system Location : ASIA (North East)
Price : On request
More detailsThe FEI Nova NanoSEM 230, D9376 is a scanning electron microscope (SEM) unit manufactured in Czechia. It inclu Location : EUROPE (Western and Northern)
Price : On request
More details- Up to 8"/200mm wafer handling - Allows small batch processing for R&D and Pilot Production - Load-locked Sys Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details- Single chamber with load lock - Currently configured for 4" wafers - Can process up to 8"/200mm wafers (wit Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details- Configured for 200mm Wafers - Single Cassette Station - Minimum Scan Step: 0.02mm - Maximum Points Per Scan: Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsHitachi SU8040 Scanning Electron Microscope, is a high-quality SEM used in various industries, research, and Location : EUROPE (Western and Northern)
Price : On request
More detailsTabletop Scanning Electron Microscope, Model TM-1000 (Hitachi High-Technologies), is an easy-to-use introduct Location : EUROPE (Western and Northern)
Price : On request
More detailsDual 300mm FIMS Standard and Oblique scanning mode, 0.060um sensitivity, 30mw Argon laser Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details300mm Advanced Thin Films measurement tool Dual 300 mm load ports, WLR, BBSE, SWE, iDesorber, Stress Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.