Hitachi S-5200 FE SEM

Grid electron microscope
Resolution: 1,8 nm at 1kV or 0,5 nm at 30kV

Magnification:
Low magnification mode: 60 to 10k x (accuracy ± 10%)
High magnification mode: 800 to 2,000k x (accuracy ± 10%)

Electron source: Cold-cathode field emission type electron source
STEM option: brightfield /darkfield STEM Detector, STEM sample holder

EDX X-MAX 80 (2012)
AZtec EDX Software Advanced

Point electronic DISS5 (2012)
Hitachi ZONE-TEM Desktop Sample Cleaner (2014)
Many additional parts and specimen holders (see pics.)

The machine is still powered on and can inspected if you wish it.
All what you can see on the photos is included.
All is in functional and good condition.