Used Metrology and inspection equipment
1,171 resultsThe KLA is complete and refurbished in 2015. No known condition issues. Year(s) : 1992 Location : EUROPE (Western and Northern)
Price : On request
More details3 Ports: 200 mm / 300 mm Refurbished Location : EUROPE (Western and Northern)
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More detailsAutomatic Defect Inspection Machine Model NSX 95 Location : EUROPE (Western and Northern)
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More detailsDOM :12/2014 O/S : Win 7 5 Camera Inline Conveyorized system 110-240V 1 ph Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer Size 200 mm Fab Section CMP General Product Information Asset Description Ebara 222 Oxide CMP-STI Softw Year(s) : 2000 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsParts machine 2008 Vintage Model NSX 105 Inspection System, 8" Year(s) : 2008 Location : EUROPE (Western and Northern)
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More detailsWafer Inspection System SFS7700 Used condition, recently came out from the working Environment. Year(s) : 1997 Location : EUROPE (Western and Northern)
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More detailsInspection system Brand Nanotronics Imaging Inc. Model nSPEC Year(s) : 2018 Location : EUROPE (Western and Northern)
Price : On request
More detailsProbe Equipment 200mm Year(s) : 1995 Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer Size 200 mm Fab Section Metrology General Product Information Vendor Supplier KLA Tencor Model UV1280SE Year(s) : 1999 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details3D Solder Paste Inspection Max Inspection Area: 20”x19.8” Max PCB: 510 x 510 mm (20.0 x 20.0 in.) Min PCB: 50 Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsele: CMM/3D measuring machine Year(s) : 2012 Location : ASIA (North East)
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More detailsUV curing device Location : ASIA (North East)
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More detailsBrand: AOI Systems Limited Type: In-line AOI Automated Optical Inspection The economic realities of quality c Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsConfigured for 200/300mm Manuals and Documentation Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsMeasurement: Film thickness/ 12in Year(s) : 2003 Location : ASIA (North East)
Price : On request
More detailsLithography Equipment BI100, s/n: BA002A408JR Year(s) : 2017 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsMicroscope Inspection Items 300mm Location : AMERICA North (USA-Canada-Mexico)
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More details200mm, s/n: PTG00690EX Year(s) : 2000 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details300mm, s/n: 530N00151A FEOL CLEAN Year(s) : 2013 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsVeeco Wyko NT3300 Profiler consisting of: - Model: NT3300 - Computer & Monitor - Keyboard & Mouse - Objective Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsKLA-TENCOR SURFSCAN 6420 PARTICLE INSPECTION SYSTEM consisting of: Model: Surfscan 6420 Particle inspection sy Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsVintage 2014 Condition: excellent CE marked Year(s) : 2014 Location : EUROPE (Western and Northern)
Price : On request
More detailsSemiprobe wafer prober mounted on Newport table Inspects diced wafers mounted on film frames Wafer stage with Location : EUROPE (Western and Northern)
Price : On request
More detailsEquipment Make: KLA-Tencor Equipment Model: SP 1-Classic Type: Inspection Machine Wafer Size: 6" to 8" Equipme Location : EUROPE (Western and Northern)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.