Used Metrology and inspection equipment
1,167 resultsCondition Good Power Requirements 380 V 3 Phase Power Consumption : 17 kw 58 BTU/hour Exterior Dimensio Year(s) : 2000 Location : EUROPE (Western and Northern)
Price : On request
More detailsThin Film measurement Version: Up to 300 MM Vintage: 01.06.2008 SENTECH Senduro 300 The SENDURO® 300 is a pow Year(s) : 2018 Location : AMERICA North (USA-Canada-Mexico)
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More detailsModel 5500 Main System Can handle from 2" up to 8"/200mm wafers Submicron sensitivity, detects 0.2 micron part Year(s) : 2007 Location : EUROPE (Western and Northern)
Price : On request
More detailsWafer Sizes: 8"/200mm Wafer defect inspection The Leica INS 3000 is the new defect review and inspection stat Year(s) : 1999 Location : EUROPE (Western and Northern)
Price : On request
More detailsCoater developer Location : ASIA (North East)
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More detailsWafer Inspection System Version: 300mm De-installed, warehoused, can be inspected by appointment Location : AMERICA North (USA-Canada-Mexico)
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More detailsWAFER SIZE 8 Year(s) : 1995 Location : EUROPE (Western and Northern)
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More detailsTEL PRECIO NANO WITH SINGLE FOUP LOADER Year(s) : 2005 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsMicroscope Model MF-UC2010C Location : ASIA (North East)
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More detailsExtra Large Board System Upgraded High Resolution Camera Measurement & Stimuli Mother Board with MONIACL (ACL) Year(s) : 2022 Location : AMERICA North (USA-Canada-Mexico)
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More detailsRate Voltage: 220 VAC Rate Current: 10A Rate Frequency: 50 Hz Equipped with Panasonic Year(s) : 2017 Location : AMERICA North (USA-Canada-Mexico)
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More details300mm Year(s) : 2005 Location : AMERICA North (USA-Canada-Mexico)
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More detailsSPUTTERS DOWN PE 2400 3 TARGET SPUTTERING SYSTEM FOR UP TO 6″ WAFERS (ANY SHAPE) RF TARGETS, 8″ DIAMETER FOR M Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsDouble Stack SRD (Set up for solar wafer use) Version: 100 mm, M0, M2 Vintage: 01.02.1999 -Semitool PSC 101 -S Year(s) : 1999 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details3D measuring platform for products of max 600mm x 600mm x 300mm lxwxh, resolution 0,0001mm. Year 2008. Year(s) : 2008 Location : EUROPE (Western and Northern)
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More detailsAOI for panel or reel to reel, max panel size 515mmx515mm, max exposure area reel to reel 250mmx500mm. with Year(s) : 2016 Location : EUROPE (Western and Northern)
Price : On request
More detailsAutomated Wafer, Die and Bump Inspection System Version: 300 mm Vintage: 01.06.2008 Dimensions on base: 72 in Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsAutomated Macro Defect Inspection Version: 150 mm/200 mm Automatic Shut down in Fab. Needs to be removed in t Location : AMERICA North (USA-Canada-Mexico)
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More detailsHigh-Tech Science Scanning White Interference Microscope <b> specification </b> ○Observation interference mi Location : ASIA (North East)
Price : On request
More detailsWafer Size 8" Vintage 2002-8 Tool's Condition Excellent - Long Scan Profiler P-15 Measurement. - Micro Head I Year(s) : 2002 Location : ASIA (North East)
Price : On request
More detailsBinocular Angle 45° Eyepieces Magnification 20 X Field Number 13 mm Focusing YES Objective Model Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsBinocular Angle 45° Eyepieces Magnification 20 X Focusing YES Magnification Range 18 X - 150 X Zo Location : AMERICA North (USA-Canada-Mexico)
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More detailsInspection: Macro defect Year(s) : 2015 Location : ASIA (North East)
Price : On request
More detailsEquipped with Magnum ion Column SFEG UHR SEM STEM capable! 5 axis stage with 100 x 100 mm XY Turbo vacuum 2 GI Location : AMERICA North (USA-Canada-Mexico)
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More detailsIs equipped with 200KV, W or LaB6, SuperTWIN lens Beautiful and high performer! It includes a single tilt hold Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.