Used Metrology and inspection equipment
1,145 resultsWafer Size 300 mm Fab Section Lab General Product Information Vendor Supplier FEI Model FEI ExSolve CLM next Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)
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More detailsStepper/6in Location : ASIA (North East)
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More detailsWafer Size 300 mm Fab Section Defect Detection General Product Information Vendor Supplier KLA Model 2835 Bri Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)
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More details14″ Max Board Width 208 VAC Dimensions: 44″ W x 63″ D x 65″ Tall Max board width (mm): 355 Max board length (m Location : EUROPE (Western and Northern)
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More detailsWorking condition Vi Technology Model Vi 3K2 Vintage 2006 Year(s) : 2006 Location : EUROPE (Western and Northern)
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More detailsBoard Inspection Test Model S3054QS Year(s) : 2004 Location : EUROPE (Western and Northern)
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More details4mega camera 8 way projection includes Review station computer. - Optional (not included) : Offline Teaching Year(s) : 2013 Location : EUROPE (Western and Northern)
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More detailsWafer Size 300 mm Fab Section Failure Analysis Tool Available Date 2024-08-27 General Product Information Vin Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer Size 300 mm Fab Section Defect Detection General Product Information Vendor Supplier AMAT Model UVision Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)
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More details200mm PCB Inspection Microscope Observation method Bright field, dark field Stage stroke X direction: 200mm Location : ASIA (North East)
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More detailsWafer Size 300 mm Fab Section Lab General Product Information Vendor Supplier FEI Model FEI ExSolve CLM Next Year(s) : 2016 Location : AMERICA North (USA-Canada-Mexico)
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More details[Main specifications] SEM ・Magnification: Secondary electron image (×10~60,000), backscattered electron image Location : ASIA (North East)
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More detailsStepper: ArF scanner/8in. Year(s) : 2003, 2004 Location : ASIA (North East)
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More detailsDigital Instruments Nanoscope III Scanning Probe Microscope Location : EUROPE (Western and Northern)
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More detailsBrand AITCO Vintage: Approximately 2019 Up to 8" capable Used Minimally for R&D & Light Production Year(s) : 2019 Location : AMERICA North (USA-Canada-Mexico)
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More detailsFab Section Failure Analysis General Product Information Vendor Supplier BRUKER Model D8 Davinci Vintage 2013 Year(s) : 2013 Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer Size 300 mm Fab Section Defect Detection General Product Information Vendor Supplier AMAT Model UVISION Year(s) : 2013 Location : AMERICA North (USA-Canada-Mexico)
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More detailsMain Specifications ・Magnification: Secondary electron image (×10~60,000), backscattered electron image (×10~3 Location : ASIA (North East)
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More detailsMain specifications -Controller: IM-6700 -Measuring head: IM-6225 (wide field of view, variable lighting type Location : ASIA (North East)
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More detailsSpecifications Observation method Bright field, dark field Stage stroke 354x302mm Total magnification 50,100, Location : ASIA (North East)
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More detailsBasic Post Reflow Automated Optical Inspection Machine Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)
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More detailsKLA / MicroSense UMA-C200-STR Thin Film Stress Measurement System consisting of: - Vintage: Approximately 20 Year(s) : 2019 Location : AMERICA North (USA-Canada-Mexico)
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More detailsBasic Post Reflow Automated Optical Inspection Machine Year: 2014 Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)
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More detailsAutomated Optical Inspection Machine Model Ultra III Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer Size 300 mm Fab Section Metrology General Product Information Vendor Supplier KLA Model Archer A500 AIM Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)
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More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.