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Used Metrology and inspection equipment

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1

For 200mm & 300mm Patterned & Unpatterned Wafers Brightfield/Darkfield Optics 2X, 3.5X, 5X & 10X Objectives 35 Location : AMERICA North (USA-Canada-Mexico)

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For 150mm & 200mm Patterned & Unpatterned Wafers For GaN & GaAs on Sapphire & Silicon Wafers Brightfield/Dark Location : AMERICA North (USA-Canada-Mexico)

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Automated Optical Inspection System Brand Pemtron Year(s) : 2020 Location : AMERICA North (USA-Canada-Mexico)

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High-Tech Science High-performance fluorescent X-ray thickness gauge [Main specifications] ・X-ray tube: Tub Year(s) : 2013 Location : ASIA (North East)

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For 200mm Patterned Wafers on Film Frames Brightfield/Darkfield Optics 2X, 5X, 10X & 20X Objectives 35X LWD Re Year(s) : 2022 Location : AMERICA North (USA-Canada-Mexico)

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Brightfield Defect Inspection Tool Cassette to Cassette YES Condition Excellent 0.25µ, 0.39µ, 0.62µ Spot Si Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)

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Wafer Size Range Minimum 300 mm Maximum 300 mm Set Size 300 mm Illumination Source Type Multi-wave Year(s) : 2016 Location : AMERICA North (USA-Canada-Mexico)

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Vendor Supplier RIGAKU Model TXRF-V300 Vintage 2007 Software Version 1.55 CIM SEC/GEM Process TXRF measurement Location : AMERICA North (USA-Canada-Mexico)

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OAI Model 806 MBA NUV 4" Mask Aligner is a four-camera, manual, optical backside mask aligner system that is d Location : AMERICA North (USA-Canada-Mexico)

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Brand: AOI Systems Limited Type: In-line AOI Automated Optical Inspection The economic realities of quality c Location : AMERICA North (USA-Canada-Mexico)

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DOM 6/2017 Per the OEM: As the true 3D AOI system, ZENITH LiTE effectively measures solder joints and compo Year(s) : 2017 Location : AMERICA North (USA-Canada-Mexico)

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Microscope Model STM7-DI Year(s) : 2015 Location : ASIA (North East)

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Tool Status Connected Wafer Size NA Fab Section Failure Analysis Asset Description Zeiss Merlin Scanning Ele Year(s) : 2010 Location : EUROPE (Western and Northern)

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Wafer Size 300 mm Fab Section Metrology General Product Information Vendor Supplier AMAT Model Verity1 SEM Vi Year(s) : 2005 Location : AMERICA North (USA-Canada-Mexico)

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Condition Refurbished S-1160B-4N Precision Manual Analytical Probe Station configured with 4" chuck upgradable Location : EUROPE (Western and Northern)

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Raider ECD310 Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)

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Brand: Manncorp Manncorp Sherlock-300B Batch AOI Machine Minimum PCB Size 2" x 3.15" (50 mm to 80 mm) Maximu Location : AMERICA North (USA-Canada-Mexico)

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Wafer Size 300 mm Fab Section Metrology General Product Information Vendor Supplier NOVA Model NOVA T600 Vint Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)

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Microscope autoloader only (Not including the microscope) Version: 100 MM AND 150 mm -Deinstalled to warehouse Location : AMERICA North (USA-Canada-Mexico)

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Wafer Size 300 mm Fab Section Metrology General Product Information Vendor Supplier HSEB (now Unity SC) Model Year(s) : 2007 Location : AMERICA North (USA-Canada-Mexico)

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Tool Status Disconnected Wafer Size 300 mm Fab Section Support Tools General Product Information Vendor Suppl Year(s) : 2009 Location : AMERICA North (USA-Canada-Mexico)

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Wafer Size 300 mm Fab Section Thin Film Asset Description THK2550-T - THK2550FP RUDOLPH S3000S (MT) Software Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)

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Wafer Size 200 mm Fab Section Metrology General Product Information Vendor Supplier KLA Tencor Model AIT II V Year(s) : 2000 Location : AMERICA North (USA-Canada-Mexico)

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AIT, 200mm, s/n: 0597-8087 Location : AMERICA North (USA-Canada-Mexico)

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Medium Current Implanter Version: 300 mm Vintage: 01.05.2007 Parts included: -Loadport TDK qty 4 -Cryogenic p Year(s) : 2007 Location : AMERICA North (USA-Canada-Mexico)

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You can find used Metrology and inspection equipment on Wotol

The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.

The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XS5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.

HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors. 

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