Used Semiconductor Equipment

Model SFS 6200 Wafer Size 8" Vintage 1994-2 Tool's Condition Excellent Description *.Configuration: - Wafe Year(s) : 1994 Location : ASIA (North East)

Price : On request

Stepper Manufacturer Ultratech Model UT1500 Year(s) : 1996 Location : EUROPE (Western and Northern)

Price : On request

De-installation complete by Nikon Tech and currently located in environmentally controlled warehouse. No miss Year(s) : 2011 Location : EUROPE (Western and Northern)

Price : On request

Developer with 3 Developer Units, 9 Hotplates and 4 Coolplates. Very good condition Power Requirements 220 V Year(s) : 2001 Location : EUROPE (Western and Northern)

Price : On request

Wafer Size Range Set Size 300 mm Condition Good Power Requirements Other V 75.0 A 50/60 Hz 3 Year(s) : 2012 Location : EUROPE (Western and Northern)

Price : On request

Wafer Size Range Minimum 200 mm Maximum 200 mm Set Size 200 mm Number of Chambers 3 Chamber 1 Desc Year(s) : 2000 Location : EUROPE (Western and Northern)

Price : On request

Microscope Accessories without x - y table Power Requirements 200-240 V 2.0 A 50/60 Hz Condition Go Year(s) : 1997 Location : EUROPE (Western and Northern)

Price : On request

Wafer Inspection System, WS-75BU, WS-70LCKT/15M Location : EUROPE (Western and Northern)

Price : On request

Condition Refurbished 200mm Patterned wafer inspection System This Tool was refurbished in 2017 and two new L Year(s) : 2001 Location : EUROPE (Western and Northern)

Price : On request

Nikon Eclipse L200N inspection microscope with brightfield and darkfield episcopic illumination Trinocular vi Location : EUROPE (Western and Northern)

Price : On request

[Specifications] - Model year: 2012 - Measurement principle: VSI method: White light vertical scanning interfe Year(s) : 2012 Location : ASIA (North East)

Price : On request

Oxford Instruments OPAL ALD Atomic Layer Deposition System. The Oxford OpAL is a plasma or thermal assisted a Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Wafer Size Range Minimum 150 mm Maximum 150 mm Set Size 150 mm Condition Good Power Requirements Year(s) : 2000 Location : EUROPE (Western and Northern)

Price : On request

Condition Good Exterior Dimensions Width 90.551 in (230.0 cm) Depth 133.858 in (340.0 cm) Height 102 Year(s) : 1997 Location : EUROPE (Western and Northern)

Price : On request

Wafer Size Range Minimum 150 mm Maximum 200 mm Set Size 200 mm Condition Excellent Power Requirements Location : EUROPE (Western and Northern)

Price : On request

AOI System Year(s) : 2007 Location : EUROPE (Western and Northern)

Price : On request

*. Process: wafer Sheet Resistance measurement *. Measurement perfomance: - 4 Point Probe check surface on Sil Year(s) : 1998 Location : ASIA (North East)

Price : On request

Laurier HA-250 Semi-Automatic Epoxy Die Bonder The unit powers up and seems to head up. Minor fixes may need Year(s) : 1994 Location : EUROPE (Western and Northern)

Price : On request

X-Ray Inspection System Model XD7600NT Location : EUROPE (Western and Northern)

Price : On request

WSS Glass Demount Wafer Size Range Set Size 200 mm Condition Very Good Year(s) : 2014 Location : EUROPE (Western and Northern)

Price : On request

The IVS120 is an automatic metrology system designed for measuring critical dimensions (CD´s). Power Requirem Year(s) : 1998 Location : EUROPE (Western and Northern)

Price : On request

Condition Good Power Requirements 220 V 24.0 A 15.0 A(2) 50 Hz 3 Phase Year(s) : 2008 Location : EUROPE (Western and Northern)

Price : On request

Wafer inspection system WS-75BU, WS-70LCKT/15M Location : EUROPE (Western and Northern)

Price : On request

Wafer Inspection System Model 7555.0 Location : EUROPE (Western and Northern)

Price : On request

The system was deinstalled in september 2002 and until that date was upgraded with various hardware and soft Location : EUROPE (Western and Northern)

Price : On request