Used Metrology and inspection equipment
1,129 resultsBinocular Angle 45° Eyepieces Model 10445111 Magnification 2 X Field Number 21 mm Focusing YES Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsMicroscope Configuration Brightfield & Darkfield Illumination Type Reflected Light Binocular Angle Variable Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicroscope Configuration Brightfield, Darkfield & DIC Illumination Type Reflected & Transmitted Light Binocu Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicroscope Configuration Brightfield Illumination Type Reflected Light Binocular Angle Variable Eyepieces Location : AMERICA North (USA-Canada-Mexico)
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More detailsIllumination Type Reflected Light Stage Type Coaxial X-Y Stage Area Length: 267 mm (10.512 in) Width: Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer Size Range Minimum 50 mm Maximum 150 mm Set Size 150 mm Alignment Optics Splitfield Video So Location : AMERICA North (USA-Canada-Mexico)
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More detailsModel Periplan GF Magnification 10 X Field Number 18 mm Focusing YES Motorized Nosepiece YES Multip Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicroscope Type Microzoom Multiple Objectives Models Bausch and Lomb 2.25 X 0.04 N.A. 8 X 0.15 N.A. 25 X 0.3 Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer Size Range Maximum 150 mm Illumination Source Type HeNe Laser Other Information Operating wavelen Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer Size Range Maximum 125 mm Controller Type Microprocessor Controller Type Controller Model C225 Ro Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicroscope Type Upright Microscope Configuration Brightfield Illumination Type Reflected Light Binocular An Location : AMERICA North (USA-Canada-Mexico)
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More detailsPatterned Wafer Contamination Analyzer Cassette to Cassette YES Condition Excellent Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer-Edge Inspection Year(s) : 2007 Location : EUROPE (Western and Northern)
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More detailsParticle Counter WAFER SIZE 12 Year(s) : 2004 Location : EUROPE (Western and Northern)
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More detailsWafer Loader 150mm Complete Sold As Is Location : EUROPE (Western and Northern)
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More details- Suss E-Rack - Qty 2 Cybor Control Module - Julabo F-30CL Chiller - Julabo FC600S Chiller - Qty 2 Coater Wa Location : AMERICA North (USA-Canada-Mexico)
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More detailsScanning Electron Microscope (SEM) Model S 4500 Location : EUROPE (Western and Northern)
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More detailsThe Electroglas 2001 wafer probers are extremely accurate, modularly designed automatic wafer probers, configu Location : AMERICA North (USA-Canada-Mexico)
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More detailsFilm Thickness Measurement System Configuration 200 MM Wafer Configuration Year(s) : 1998 Location : AMERICA North (USA-Canada-Mexico)
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More detailsEVG 620 MASK ALIGNER consisting of: - Model: EVG620 (Upgraded from a 420) - Manual Mask Aligner - Topside Ali Location : AMERICA North (USA-Canada-Mexico)
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More details160 kV 20 W Nanotech source, feature recognition 500 nm. 5 axis manipulator, max supported weight 5 kg. Max sa Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer Size: 200mm Desktop Mercury Probe CV Mapper CV92A Embedded computer and a PC Up to 200 mm - 8 inch capab Location : AMERICA North (USA-Canada-Mexico)
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More detailsThe ASET-F5x thin film metrology system can measure materials across a continuous wavelength spectrum from 1 Location : AMERICA North (USA-Canada-Mexico)
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More detailsSemi Auto Pad Shave Tool RSV Automation PDS01 Year(s) : 2002 Location : AMERICA North (USA-Canada-Mexico)
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More detailsworking condition Year(s) : 2015 Location : EUROPE (Western and Northern)
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More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.