Used Metrology and inspection equipment
1,129 resultsWafer ID Reader Optical Inspect Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsAOI system Revised, ready to work. Available for immediate delivery. Contact us for details: contact@elmotek. Year(s) : 2011 Location : EUROPE (Western and Northern)
Price : On request
More detailsAOI system Location : EUROPE (Western and Northern)
Price : On request
More detailsAOI Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsLaser Marker Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYTV-FX 2D AOI Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsFSICL MECURRY PROCESS Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsFSICL MECURRY PROCESS Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsTRF6 HIMS-A01-T RETICLE MACRO INSPECTION TOOL(EVAL TOOL) (former LRIS-02) Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsKLA AITXUV, 300mm, s/n: UV1005R Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsWafer Size 300 mm Fab Section Metrology General Product Information Vendor Supplier KLA Singapore Model AITXU Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsTransaction Information Tool Status Disconnected Wafer Size 300 mm Fab Section Metrology General Product Info Year(s) : 2005 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsTransaction Information Tool ID YDFI735 Tool Status Disconnected Wafer Size 300 mm Fab Section Metrology Gene Year(s) : 2005 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsTransaction Information Tool ID EE-EME-03 Wafer Size 300 mm Fab Section Etch General Product Information Vend Year(s) : 2005 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsSemi-Automatic BGA Rework Station Nozzles Included Maximum Board Size: 18” x 22” (458mm x 560mm) Minimum Compo Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsKLA-TENCOR PROMETRIX RS55/TC FOUR POINT PROBE RESISTIVITY MAPPING SYSTEM consisting of: - Model: RS55/tc - Tem Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsTool ID YEBI731 (F7 YEBI703) Tool Status Connected Wafer Size 300 mm Fab Section Defect Detection General Pro Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsS-4500 with a semi-in-lens type objective lens and cold field emission electron source suited to high resoluti Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsTool ID CVQBD-02 Tool Status Connected Wafer Size 200 mm Asset Description MDC FOR GATE OXIDE ANALYSIS Softwar Year(s) : 2002 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsAMAT NanoSEM 3D, 300mm Year(s) : 2004 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsBare Wafer Surface Defect Inspection System The Surfscan 6400 is a highly advanced inspection system desig Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsSurface Inspection System Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsUnpatterned Surface Inspection System Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsIn addition to its advanced data analysis software, the ADE 7200 offers a user-friendly interface that makes Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsThe system features a high-resolution, double-sided non-contact measurement array with a sophisticated silic Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.