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Used Laboratory and Testing equipment

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Rudolph Auto EL IV-Hg Ellipsometer Rudolph Auto EL-IV-Hg Multi-Wavelength Automatic Ellipsometer *User can se Location : AMERICA North (USA-Canada-Mexico)

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Nanometrics Nanospec AFT 200 * Manual system Location : AMERICA North (USA-Canada-Mexico)

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Nanometrics AFT 210UV * Nanometrics 210UV * Film Measurement System * Stage - 4" wafers - larger stage can b Location : AMERICA North (USA-Canada-Mexico)

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Nanometrics Nanospec AFT 210XP Film Measurement System. *System is in excellent "like new" condition. *Read Location : AMERICA North (USA-Canada-Mexico)

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Rudolph Auto EL III Ellipsometer EQP-00470 * Serial tag info: 24A, Serial # 7367, June 1983 * Ellipsometer, 6 Location : AMERICA North (USA-Canada-Mexico)

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Rudolph Auto EL III Ellipsometer *Serial Tag info: 2C4C, Serial # 7511, July/1984 *Ellipsometer, 633nm wavele Location : AMERICA North (USA-Canada-Mexico)

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Rudolph Auto EL II Ellipsometer *Ellipsometer, 633nm wavelength *Built-in printer *Measuring Time: 17 to 50 Location : AMERICA North (USA-Canada-Mexico)

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Rudolph FE IV Ellipsometer Specifications: System: The Rudolph FE III series is a focused beam ellipsometer f Location : AMERICA North (USA-Canada-Mexico)

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Nanometrics Nanoline AFT 4000 * Table top automated film thickness and reflectivity system. * Standard Film Location : AMERICA North (USA-Canada-Mexico)

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Nanometrics 215 Automated Film Thickness Tool. * Cassette to cassette operation. 3¿ to 6¿ wafer capability. Location : AMERICA North (USA-Canada-Mexico)

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Nanometrics Nanospec AFT 181 (Nanospec AFT 181) Computerized Film Thickness Measurement Nanometrics 181. Mic Location : AMERICA North (USA-Canada-Mexico)

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Nanometrics Nanospec AFT 181 (Nanospec AFT 181) Computerized Film Thickness Measurement Nanometrics 181 with Location : AMERICA North (USA-Canada-Mexico)

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Nanometrics Nanospec AFT 180 (Nanospec AFT 180) Nanometrics 180 * Microspectrophotometer head can measure in Location : AMERICA North (USA-Canada-Mexico)

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Nanometrics Nanospec AFT 180 (Nanospec AFT 180) Location : AMERICA North (USA-Canada-Mexico)

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Nanometrics Nanoline V CD Measure Location : AMERICA North (USA-Canada-Mexico)

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Nanometrics Nanoline IV CD Measure Measures line widths, gaps, holes and registration alignment. Range 0.5 to Location : AMERICA North (USA-Canada-Mexico)

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Gaertner Dual Wavelength Mapping System (L125B) * He-Ne 6328A red laser * He-Cd 4416A blue laser * Auto gai Location : AMERICA North (USA-Canada-Mexico)

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Nanometrics Nanoline CRD III Measure (Nanoline CRD III Measure) Location : AMERICA North (USA-Canada-Mexico)

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Nanometrics Nanoline CD 50 Measure (Nanometrics Nanoline CD 50) Nanometrics Nanoline CD 50 Line width Measur Location : AMERICA North (USA-Canada-Mexico)

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Nanometrics Nanoline 50 CD Measurement System - Model Nanoline 50, Main System - Capable of Measuring up to 4 Location : AMERICA North (USA-Canada-Mexico)

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KLA 8020 AIT s/n 0800-824 Location : AMERICA North (USA-Canada-Mexico)

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KLA - Tencor UV 1080 * Prometrix UV-1080 * Max wafer capable: 200mm * Intel Pentium III Computer * Windows Location : AMERICA North (USA-Canada-Mexico)

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Gaertner L117 Ellipsometer *No data output, only a null meter *All data must be manually calculated *Simple m Location : AMERICA North (USA-Canada-Mexico)

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Gaertner L116 Ellipsometer *No data output, only a null meter *All data must be manually calculated *Simple m Location : AMERICA North (USA-Canada-Mexico)

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Gaertner L115 Ellipsometer Location : AMERICA North (USA-Canada-Mexico)

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You can find used Laboratory and Testing equipment on Wotol

For second hand Laboratory and Testing equipment we have Laboratory equipmentand Testing instrument for electronics. The main manufacturers for used Laboratory and Testing equipment are Agilent, Keysight, Hewlett Packard (HP), Tektronix, Anritsu, Teradyne, Keithley, Rohde & Schwarz, Tencor, Acterna, Advantest, Dage, Rudolph, Nanometrics. The main models are 

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