Used Laboratory and Testing equipment

Brand: Signatrone Signatrone 4 point probe * Model 301 * Customer must purchase a Keithley (or equivalent) d Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Brand: Semiconductor Diagnostics Inc Semiconductor Diagnostics Inc. SPV CMS 4010 (SPV CMS 4010) * Model SPV Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Rudolph FTM ellipsometer *Precise: 1nm resolution *Fast Operation: 4 seconds per measurement *Set film type, Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Rudolph Auto EL IV-Hg Ellipsometer Rudolph Auto EL-IV-Hg Multi-Wavelength Automatic Ellipsometer *User can se Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Nanometrics Nanospec AFT 200 * Manual system Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Nanometrics AFT 210UV * Nanometrics 210UV * Film Measurement System * Stage - 4" wafers - larger stage can b Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Nanometrics Nanospec AFT 210XP Film Measurement System. *System is in excellent "like new" condition. *Read Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Rudolph Auto EL III Ellipsometer EQP-00470 * Serial tag info: 24A, Serial # 7367, June 1983 * Ellipsometer, 6 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Rudolph Auto EL III Ellipsometer *Serial Tag info: 2C4C, Serial # 7511, July/1984 *Ellipsometer, 633nm wavele Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Rudolph Auto EL II Ellipsometer *Ellipsometer, 633nm wavelength *Built-in printer *Measuring Time: 17 to 50 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Rudolph FE IV Ellipsometer Specifications: System: The Rudolph FE III series is a focused beam ellipsometer f Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Nanometrics Nanoline AFT 4000 * Table top automated film thickness and reflectivity system. * Standard Film Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Nanometrics 215 Automated Film Thickness Tool. * Cassette to cassette operation. 3¿ to 6¿ wafer capability. Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Nanometrics Nanospec AFT 181 (Nanospec AFT 181) Computerized Film Thickness Measurement Nanometrics 181. Mic Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Nanometrics Nanospec AFT 181 (Nanospec AFT 181) Computerized Film Thickness Measurement Nanometrics 181 with Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Nanometrics Nanospec AFT 180 (Nanospec AFT 180) Nanometrics 180 * Microspectrophotometer head can measure in Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Nanometrics Nanospec AFT 180 (Nanospec AFT 180) Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Nanometrics Nanoline V CD Measure Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Nanometrics Nanoline IV CD Measure Measures line widths, gaps, holes and registration alignment. Range 0.5 to Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Gaertner Dual Wavelength Mapping System (L125B) * He-Ne 6328A red laser * He-Cd 4416A blue laser * Auto gai Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Nanometrics Nanoline CRD III Measure (Nanoline CRD III Measure) Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Nanometrics Nanoline CD 50 Measure (Nanometrics Nanoline CD 50) Nanometrics Nanoline CD 50 Line width Measur Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Nanometrics Nanoline 50 CD Measurement System - Model Nanoline 50, Main System - Capable of Measuring up to 4 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

KLA 8020 AIT s/n 0800-824 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

KLA - Tencor UV 1080 * Prometrix UV-1080 * Max wafer capable: 200mm * Intel Pentium III Computer * Windows Location : AMERICA North (USA-Canada-Mexico)

Price : On request