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Nanometrics

Ref : 1873926-9-GO
Condition : Used
Manufacturer : Nanometrics
Model : -
Short Description : -
Year(s) : -
Quantity : 0
Location : Seller or machines location:
AMERICA North (USA-Canada-Mexico)
Last check : 06 Sep. 2018

Nanometrics Nanospec AFT 181 (Nanospec AFT 181)

Computerized Film Thickness Measurement Nanometrics 181. Microspectrophotometer head can measure in wavelength range 480-790 nm. Standard films measured silicon dioxide and nitride, negative and positive resists, nitrides, oxides, and polymides. Measures from 400A to 40,000A.

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