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Nanometrics

Ref : 1873989-9-GO
Condition : Used
Manufacturer : Nanometrics
Model : -
Short Description : -
Year(s) : -
Quantity : 0
Location : Seller or machines location:
AMERICA North (USA-Canada-Mexico)
Last check : 06 Sep. 2018

Nanometrics 215 Automated Film Thickness Tool.

* Cassette to cassette operation. 3¿ to 6¿ wafer capability.
* Measurement spot size 5 µm to 50 µm.
* Up to 500 measurements per wafer in mapping mode.
* Measures from 100 angstrom to 50,000 angstroms.

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