Used Laboratory and Testing equipment

In-circuit high tester Year(s) : 2018 Location : ASIA (North East)

Price : On request

Flying probe tester, auto loader for rigid panels, soft probes, Kelvin capable test heads + Kelvin software li Year(s) : 2010 Location : EUROPE (Western and Northern)

Price : On request

Test & Measurement Year(s) : 2001 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Test & Measurement Year(s) : 2001 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Main body with cassette loader including: - CE Mark - Automatic Probe to Pad Alignment - Automatic Needle Heig Year(s) : 2016 Location : EUROPE (Western and Northern)

Price : On request

Model: 2287i-9739-DE Cards: 9004-0225- Pin Cards x18, 2277-4018-Clock Sync Trigger Board x1 , 2277-4021-COMBO Location : AMERICA North (USA-Canada-Mexico)

Price : On request

System chassis: 4-module frame with 2 modules populated. Controller: RP5800 with Windows 10 External power bay Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Amplitude Accuracy +/-0.3 dB Dynamic Range +30 dBM - -139 dBm Frequency Range 9 kHz - 43 GHz Input Impedance 5 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Wafer Size 300 mm Fab Section Metrology General Product Information Vendor Supplier Robotics Vision Systems i Year(s) : 2003 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Wafer Size 200 mm Fab Section Test General Product Information Vendor Supplier Keysight Technologies Model 40 Year(s) : 1997 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

300mm, s/n: 205-0291/ 07F011 Year(s) : 2009 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

In-circuit Tester Year(s) : 2002 Location : ASIA (North East)

Price : On request

Wafer Size 200 mm Fab Section Test General Product Information Vendor Supplier Keysight Technologies Model 40 Year(s) : 1997 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Vintage : MAY 1996 220V 1 Phase Specifications Flying Prober, Fixtureless Tester with AOI Vision 4 Probe High Year(s) : 1996 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

A5 Flying Probe Test System-Autoload, Type: A5-826 Soft Touch version, 4 Probes per Side S/N 10 05 A5SA 007, Y Year(s) : 2010 Location : EUROPE (Western and Northern)

Price : On request

Microcraft Emma Moving Probe Bare Board Tester The Microcraft EMMA ELX6146 High Speed/Accuracy fixtureless tes Location : EUROPE (Western and Northern)

Price : On request

25 pin kerf tester Tool ID: K264 Year(s) : 2001 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Keysight 4062UX, 200mm, s/n: 2848J00897 Year(s) : 1997 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Wafer Size 200 mm Fab Section Test General Product Information Vendor Supplier Keysight Technologies Model 40 Year(s) : 1997 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

S630, s/n: QMO4102 Year(s) : 2010 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Observation window Yes Temperature range -40 to +150°C Shelf 1 piece Humidity range 30 to 95%rh Cable hole Φ Year(s) : 2015 Location : ASIA (North East)

Price : On request

Test frequency: 120 (100) Hz, 1 kHz and 10 kHz Meter is capable of a wide range of applications: measuring ele Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Dimensions: 14x17x17 Weight: 35.00 lbs Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Insp: Spectrometer(FTIR) Year(s) : 2019 Location : ASIA (North East)

Price : On request

Flying Probe System Build: 1998 Condition: Used – Can be used for parts OEM Part number: S20 Year(s) : 1998 Location : EUROPE (Western and Northern)

Price : On request