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Used Laboratory and Testing equipment

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Tencor M-Gage 300 with Allwin21 computer upgrade * Non-Contact Wafer Monitor for Sheet resistance. * Can acco Location : AMERICA North (USA-Canada-Mexico)

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KLA/Tencor P-20H Long Scan Profiler * Long Scan Profiler Measurement of vertical features ranging from 100 Location : AMERICA North (USA-Canada-Mexico)

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Brand: DEKTAK DEKTAK Model 8000 Surface profile 200 mm sample stage, 1A resolution at 65 kA, Windows interfa Location : AMERICA North (USA-Canada-Mexico)

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Brand: Dektak Dektak 3ST Profilometer * Vertical range: 100A to 1,310KA. * Vertical resolution: 1A/65KA, 10A Location : AMERICA North (USA-Canada-Mexico)

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Brand: Dektak Dektak 3030ST Profilometer. * Measurement Range: 50A to 1,310KA * Verticle Resolution: 1A * Sc Location : AMERICA North (USA-Canada-Mexico)

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KLA Tencor P-20 Profilometer * Long Scan Profiler Measurement of vertical features. * Measurement of vertical Location : AMERICA North (USA-Canada-Mexico)

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Tencor Auto OmniMap RS55 / tc * Four Point Probe Resistivity Mapping System with Temperature Compensation a Location : AMERICA North (USA-Canada-Mexico)

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Tencor Alpha Step 200 Profilometer (Tencor AS-200 Profilometer) The Alpha Step 200 profilometer is used to me Location : AMERICA North (USA-Canada-Mexico)

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Rudolph FE IV Ellipsometer (FE IV Ellipsometer) Specifications: System: The Rudolph FE III series is a focus Location : AMERICA North (USA-Canada-Mexico)

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Rudolph Auto EL III Ellipsometer EQP-00470 * Serial tag info: 24A, Serial # 7367, June 1983 * Ellipsometer, 6 Location : AMERICA North (USA-Canada-Mexico)

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Rudolph Auto EL III Ellipsometer *Serial Tag info: 2C4C, Serial # 7511, July/1984 *Ellipsometer, 633nm wavele Location : AMERICA North (USA-Canada-Mexico)

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Rudolph Auto EL II Ellipsometer (Auto EL II Ellipsometer) *Ellipsometer, 633nm wavelength *Built-in printer Location : AMERICA North (USA-Canada-Mexico)

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Brand: Plasmos Plasmos SD-4000 Ellipsometer *Comes equipt with pattern recognition Location : AMERICA North (USA-Canada-Mexico)

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Brand: Plasmos Plasmos Ellipsometer 2300 (Plasmos Ellipsometer 2300) Location : AMERICA North (USA-Canada-Mexico)

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Gaertner L116 Ellipsometer (L116 Ellipsometer) *No data output, only a null meter *All data must be manually Location : AMERICA North (USA-Canada-Mexico)

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Gaertner L115 Ellipsometer (L115 Ellipsometer) Location : AMERICA North (USA-Canada-Mexico)

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Gaertner Dual Wavelength Mapping System (L125B) * He-Ne 6328A red laser * He-Cd 4416A blue laser * Auto gai Location : AMERICA North (USA-Canada-Mexico)

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Rudolph Auto EL-IV Ellipsometer * Multi-Wavelength Automatic Ellipsometer. * User can select between 3 wavel Location : AMERICA North (USA-Canada-Mexico)

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Gaertner L116S Ellipsometer * Fully Operational * PC controlled for measurement * Simple manual stage 8" capa Location : AMERICA North (USA-Canada-Mexico)

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Brand: Skyline Instruments Chair Armrest Testing Machine is used to evaluate the pull-resistance ability of t Location : ASIA (China - Taiwan - HKG)

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Brand: Skyline Instruments Chair Seat Impact Testing Machine Application This test applies to all types of Location : ASIA (China - Taiwan - HKG)

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Brand: Skyline Instruments Chair Swivel Testing Machine Specifications: According to test Standard: BIFMA X5 Location : ASIA (China - Taiwan - HKG)

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Brand: Skyline Instruments Drawer durability cycle testing machine. This machine is designed to test drawer Location : ASIA (China - Taiwan - HKG)

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Brand: Skyline Instruments Zipper Tester, to determine the resistance to reciprocation of zipper (slide faste Location : ASIA (China - Taiwan - HKG)

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Brand: Skyline Instruments Temperature and Humidity Chamber 1 Performance: (for no-load, the air-cooled at r Location : ASIA (China - Taiwan - HKG)

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You can find used Laboratory and Testing equipment on Wotol

For second hand Laboratory and Testing equipment we have Laboratory equipmentand Testing instrument for electronics. The main manufacturers for used Laboratory and Testing equipment are Agilent, Keysight, Hewlett Packard (HP), Tektronix, Anritsu, Teradyne, Keithley, Rohde & Schwarz, Tencor, Acterna, Advantest, Dage, Rudolph, Nanometrics. The main models are 

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