Used Laboratory and Testing equipment

System was originally set up for disks but can easily be converted for wafers. Three dimensional and selected Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Microhead sr Green probe tip (2um radius, 60 degree's),3.1 windows operating system Tencor software version 2. Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Three dimensional and selected two dimensional data display. Scan length 60 mm. Step height repeatability, 0.0 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Non-Contact Wafer Monitor for Sheet resistance. Can accommodate up to 5". Measurement range: 1m ohm/square t Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Non-Contact Wafer Monitor for Sheet resistance. 115v, 60 hz Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Wafer size: 125mm-200mm Temperatures up to 900C Dual wavelength technology MS Windows based software Power: 23 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

KLA/Tencor Flexus 2908 Wafer size: 125mm-200mm Temperatures up to 900C Dual wavelength technology MS Windows Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Tencor P-11 Profilometer Microhead sr Green probe tip (2um radius, 60 degree's),3.1 windows operating system Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Tencor P-2 Long Scan Profilometer * Scan Length: 210mm. * Scan Speed: 1 um/sec to 25mm/sec. * Vertical ran Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Veeco FPP-5000 Four Point Probe * EQP-00845-SI * Resistivity measurement tool * Easy to operate, simply load Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Veeco FPP 100 * Automatic Four Point Probe * Resistivity measurement tool * Digital display and computation. Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Tencor P-2H Long Scan Profilometer. * Scan Length: 210mm. Scan * Speed: 1 um/sec to 25mm/sec. * Vertical r Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Tencor P-12 Surface Profiler. System was originally set up for disks but can easily be converted for wafers. Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Tencor P-10 Surface Profiler. Three dimensional and selected two dimensional data display. Scan length 60 mm. Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Tencor M-Gage 200 * Non-Contact Wafer Monitor for Sheet resistance. * Can accommodate up to 5". * Measureme Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Tencor M-Gage. Non-Contact Wafer Monitor for Sheet resistance. 115v, 60 hz Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Tencor Alpha Step 250 Profilometer (Alpha Step 250 Profilometer) The Alpha-Step 250 is used to measure step Location : AMERICA North (USA-Canada-Mexico)

Price : On request

KLA/Tencor Flexus 2900 diffusion coefficient in dielectric films, linear regression and stress-temp or stres Location : AMERICA North (USA-Canada-Mexico)

Price : On request

KLA / Tencor AlphaStep 500 Profilometer * Computer controlled Scanning and data collection * Comprehensive d Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Tencor Alpha Step 300 Profilometer (Alpha Step 300 Profilometer) Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Veeco Dektak 3030ST Auto II Profilometer. * Measurement Range: 50A to 1,310KA * Verticle Resolution: 1A * Sc Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Brand: Signatrone Signatrone 4 point probe * Model # 301-4 * Customer must purchase a Keithley (or equivalen Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Brand: Signatrone Signatrone 4 point probe * Model 301 * Customer must purchase a Keithley (or equivalent) d Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Brand: Semiconductor Diagnostics Inc Semiconductor Diagnostics Inc. SPV CMS 4010 (SPV CMS 4010) * Model SPV Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Rudolph FTM ellipsometer *Precise: 1nm resolution *Fast Operation: 4 seconds per measurement *Set film type, Location : AMERICA North (USA-Canada-Mexico)

Price : On request