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Used Laboratory and Testing equipment

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This is the "Base and Handler" only for a Tencor P2. Location : AMERICA North (USA-Canada-Mexico)

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Manufacturer: Tencor Email Us Want to Service Want to Sell Related Products Mfg. Part#: Tencor P-2H Profil Location : AMERICA North (USA-Canada-Mexico)

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* Scan Length: 210mm. * Scan Speed: 1 um/sec to 25mm/sec. * Vertical range: +/- 6.5um at 1A resolution & +/- Location : AMERICA North (USA-Canada-Mexico)

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System was originally set up for disks but can easily be converted for wafers. Three dimensional and selected Location : AMERICA North (USA-Canada-Mexico)

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Microhead sr Green probe tip (2um radius, 60 degree's),3.1 windows operating system Tencor software version 2. Location : AMERICA North (USA-Canada-Mexico)

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Three dimensional and selected two dimensional data display. Scan length 60 mm. Step height repeatability, 0.0 Location : AMERICA North (USA-Canada-Mexico)

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Non-Contact Wafer Monitor for Sheet resistance. Can accommodate up to 5". Measurement range: 1m ohm/square t Location : AMERICA North (USA-Canada-Mexico)

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Non-Contact Wafer Monitor for Sheet resistance. 115v, 60 hz Location : AMERICA North (USA-Canada-Mexico)

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Wafer size: 125mm-200mm Temperatures up to 900C Dual wavelength technology MS Windows based software Power: 23 Location : AMERICA North (USA-Canada-Mexico)

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KLA/Tencor Flexus 2908 Wafer size: 125mm-200mm Temperatures up to 900C Dual wavelength technology MS Windows Location : AMERICA North (USA-Canada-Mexico)

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Tencor P-11 Profilometer Microhead sr Green probe tip (2um radius, 60 degree's),3.1 windows operating system Location : AMERICA North (USA-Canada-Mexico)

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Tencor P-2 Long Scan Profilometer * Scan Length: 210mm. * Scan Speed: 1 um/sec to 25mm/sec. * Vertical ran Location : AMERICA North (USA-Canada-Mexico)

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Veeco FPP-5000 Four Point Probe * EQP-00845-SI * Resistivity measurement tool * Easy to operate, simply load Location : AMERICA North (USA-Canada-Mexico)

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Veeco FPP 100 * Automatic Four Point Probe * Resistivity measurement tool * Digital display and computation. Location : AMERICA North (USA-Canada-Mexico)

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Tencor P-2H Long Scan Profilometer. * Scan Length: 210mm. Scan * Speed: 1 um/sec to 25mm/sec. * Vertical r Location : AMERICA North (USA-Canada-Mexico)

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Tencor P-12 Surface Profiler. System was originally set up for disks but can easily be converted for wafers. Location : AMERICA North (USA-Canada-Mexico)

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Tencor P-10 Surface Profiler. Three dimensional and selected two dimensional data display. Scan length 60 mm. Location : AMERICA North (USA-Canada-Mexico)

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Tencor M-Gage 200 * Non-Contact Wafer Monitor for Sheet resistance. * Can accommodate up to 5". * Measureme Location : AMERICA North (USA-Canada-Mexico)

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Tencor M-Gage. Non-Contact Wafer Monitor for Sheet resistance. 115v, 60 hz Location : AMERICA North (USA-Canada-Mexico)

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Tencor Alpha Step 250 Profilometer (Alpha Step 250 Profilometer) The Alpha-Step 250 is used to measure step Location : AMERICA North (USA-Canada-Mexico)

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KLA/Tencor Flexus 2900 diffusion coefficient in dielectric films, linear regression and stress-temp or stres Location : AMERICA North (USA-Canada-Mexico)

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KLA / Tencor AlphaStep 500 Profilometer * Computer controlled Scanning and data collection * Comprehensive d Location : AMERICA North (USA-Canada-Mexico)

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Tencor Alpha Step 300 Profilometer (Alpha Step 300 Profilometer) Location : AMERICA North (USA-Canada-Mexico)

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Veeco Dektak 3030ST Auto II Profilometer. * Measurement Range: 50A to 1,310KA * Verticle Resolution: 1A * Sc Location : AMERICA North (USA-Canada-Mexico)

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Brand: Signatrone Signatrone 4 point probe * Model # 301-4 * Customer must purchase a Keithley (or equivalen Location : AMERICA North (USA-Canada-Mexico)

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You can find used Laboratory and Testing equipment on Wotol

For second hand Laboratory and Testing equipment we have Laboratory equipmentand Testing instrument for electronics. The main manufacturers for used Laboratory and Testing equipment are Agilent, Keysight, Hewlett Packard (HP), Tektronix, Anritsu, Teradyne, Keithley, Rohde & Schwarz, Tencor, Acterna, Advantest, Dage, Rudolph, Nanometrics. The main models are 

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