Used Metrology and inspection equipment
1,231 resultsHitachi SU8040 Scanning Electron Microscope, is a high-quality SEM used in various industries, research, and Location : EUROPE (Western and Northern)
Price : On request
More detailsTabletop Scanning Electron Microscope, Model TM-1000 (Hitachi High-Technologies), is an easy-to-use introduct Location : EUROPE (Western and Northern)
Price : On request
More detailsDual 300mm FIMS Standard and Oblique scanning mode, 0.060um sensitivity, 30mw Argon laser Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details300mm Advanced Thin Films measurement tool Dual 300 mm load ports, WLR, BBSE, SWE, iDesorber, Stress Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsVIscom S 3088 II AOI in good condition. Vintage: 2008 Operating system: Windows XP 8M-CBW combo module with 4 Year(s) : 2008 Location : EUROPE (Western and Northern)
Price : On request
More detailsXray Diffractometers, 300mm Location : AMERICA North (USA-Canada-Mexico)
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More detailsAligner/Double-sided Year(s) : 2001 Location : ASIA (North East)
Price : On request
More detailsGöpel Multicam Line in excellent condition Vintage: 2018 Features: • Multi camera image acquisition module (c Year(s) : 2018 Location : EUROPE (Western and Northern)
Price : On request
More detailsXray Diffractometers 300mm Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)
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More detailsAligner: Mask aligner/4in Year(s) : 2010 Location : ASIA (North East)
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More detailsInspection System Model Candela 8620 Year(s) : 2013 Location : EUROPE (Western and Northern)
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More detailsFilm Thickness Measurement System Metrology Equipment Date of Manufacture: 2001-12-31 Currently Configured for Year(s) : 2001 Location : EUROPE (Western and Northern)
Price : On request
More detailsBrand: Koh Young Technology Power: 220V a.c Type: 3D SPI FEATURES: - Inspection speed at 0.24sec/FOV - 3D Sha Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsThin Film Stress Measurement System, 150 mm and 200 mm wafer Location : AMERICA North (USA-Canada-Mexico)
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More detailsFRONT SIDE ALIGNMENT HIGH RESOLUTION ALIGNMENT FOR UP TO 4″ WAFERS SUSS POWER SUPPLY Year(s) : 2019 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details12.25×12.25 SQUARE BEAM (EXPOSURE HEAD IS MOTORIZED) 500 WATT LAMP, SPLIT FIELD VIDEO OPTICS WITH FLAT SCREEN Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsSi wafers, 200/300mm wafers, Bright and Dark Field, 0.2 um pixel size, 10.5 Soft version, RBB classification Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsSi, Gan & Gas, Saphire 150/200mm, Bright and Dark Field, 0.2 um pixel size, 10.5 Soft version, RBB classificat Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsDual 300mm FIMS – DBS, SE, Stress, 200/300 mm chuck, Win NT, Summit 3.3, upgradable Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsThin Film measurement tool Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsMetrology Location : AMERICA North (USA-Canada-Mexico)
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More detailsScanning Electron Microscopes 300mm, s/n: UV1158 Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsBrightfield Inspection 300mm, s/n: 1340334 Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsLithography Equipment, 200mm, s/n: 2070 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsFilm thickness measurement, 200mm, s/n: 6454 Year(s) : 1997 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.