Used Metrology and inspection equipment
1,257 resultsSpecifications ・Controller: IM-6600 ・Measuring Head: IM-6120 ・Image Sensor: 6.6 Megapixel CMOS (Monochrome) ・D Location : ASIA (North East)
Price : On request
More detailsHours: 10 hours - Demo Machine! Sealed Micro-Focus X-Ray Tube 90KV Current Range 10-200 μA Max Output Power 8W Location : AMERICA North (USA-Canada-Mexico)
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More detailsSEM S-4700 with EDAX Year(s) : 2002 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsmeasurement: Non-Contact type resistance measurement Year(s) : 2012 Location : ASIA (North East)
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More detailsCategory: Metrology Maker: KLA Model: MIS-200 Wafer Size: 200 Process: Inspection Config Review inspection. N Location : EUROPE (Western and Northern)
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More details50Hz/60Hz Missing Parts: Controller PCB cards, Handling Robot and Controller 2005 Vintage Year(s) : 2005 Location : EUROPE (Western and Northern)
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More detailsSEMITOOL 1-CHAMBER 300MM SPRAY ACID TOOL (SAT) consisting of: - Model: SAT-1100S1PSHU - Spray Acid Tool (SAT) Location : AMERICA North (USA-Canada-Mexico)
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More detailsMeasurement: Film thickness/6in Year(s) : 2020 Location : ASIA (North East)
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More detailsInspection: Thermawave Year(s) : 1998 Location : ASIA (North East)
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More detailsCompletely maintained Scanning Electron Microscope with IXRF EDS detector included Location : AMERICA North (USA-Canada-Mexico)
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More detailsWet Process Equipment 200mm Year(s) : 1999 Location : AMERICA North (USA-Canada-Mexico)
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More detailsAOI for rigid panel or flex reel to reel feed, rigid panels max panel size 515mm x 515mm. Year(s) : 2019 Location : EUROPE (Western and Northern)
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More details- Type II - EDX 1) Performance Resolution: - 1.5 nm guaranteed (at accelerating voltage 15 kV, working distan Year(s) : 1997 Location : EUROPE (Western and Northern)
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More detailsCritical Dimension Scanning Electron Microscopes, 300mm, s/n: U-666 Year(s) : 2004 Location : AMERICA North (USA-Canada-Mexico)
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More detailsParticle counter for transparent wafer 6 Inch As is cold down Was working before de-install, Year(s) : 2011 Location : EUROPE (Western and Northern)
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More detailsCentura TCCP – TAN Ox Location : AMERICA North (USA-Canada-Mexico)
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More detailsThin Films measurement tool, 8300 XSE Film Thickness Analyzer, Semi Automatic loader (150, 200, and 300mm wafe Location : AMERICA North (USA-Canada-Mexico)
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More detailsDOM: August 2013 457 x 308 mm (18” x 12”) inspection area 12 um high-resolution, high-speed CMOS cameras Inspe Year(s) : 2013 Location : AMERICA North (USA-Canada-Mexico)
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More details457 x 308 mm (18” x 12”) inspection area 12 um high-resolution, high-speed CMOS cameras Inspection Speed 200cm Year(s) : 2016 Location : AMERICA North (USA-Canada-Mexico)
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More detailsDOM: May 2011 The VisionMaster® AP212 incorporates high-resolution PCB positioning with sophisticated, 3-dime Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)
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More detailsFinetech Fineplacer Rework Station Year(s) : 2021 Location : AMERICA North (USA-Canada-Mexico)
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More detailsDOM: February 2015 457 x 308 mm (18” x 12”) inspection area 12 um high-resolution, high-speed CMOS cameras In Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsOmron VT-X700-L X-Ray System Inline 3D X-Ray System DOM: 2017 Large Board Option Micro-focus closed tube (130 Year(s) : 2017 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsDOM: November 2013 457 x 308 mm (18” x 12”) inspection area 12 um high-resolution, high-speed CMOS cameras Ins Year(s) : 2013 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsPower Requirements 230 V 16.0 A Condition Excellent Year(s) : 2007 Location : EUROPE (Western and Northern)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.