Used Metrology and inspection equipment
1,124 resultsCondition: Very Good Configuration: 12" Wafer sorter with: 2x Fixload V6 Multiple IOSS Wafer ID Reader 2x Bro Year(s) : 2001 Location : EUROPE (Western and Northern)
Price : On request
More detailsPCB Size supported: From L50mm x W 50mm to L460mm x W360mm Inspection time: 0.2sec / inspection area Year(s) : 2006 Location : ASIA (South East)
Price : On request
More details60A Spin/Expose/Develop Year(s) : 1997 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details80 B Coat/Track 56700-3354 Year(s) : 1997 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsWafer ID Reader Optical Inspect Location : AMERICA North (USA-Canada-Mexico)
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More detailsAOI system Revised, ready to work. Available for immediate delivery. Contact us for details: contact@elmotek. Year(s) : 2011 Location : EUROPE (Western and Northern)
Price : On request
More detailsAOI system Location : EUROPE (Western and Northern)
Price : On request
More detailsVintage : NOV 2015 Details 3D AOI Dual Lane Capability 120/210 Voltage Specifications This high-end inspect Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsAOI System Type: 3D AOI Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsAOI System Type: 3D AOI Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsDage XD7800NT Large Board X-Ray System Windows 10 160KVa 10 watt NT950 Tube XiDAT3 Image intensifier Very Lar Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsAOI Location : AMERICA North (USA-Canada-Mexico)
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More detailsLaser Marker Location : AMERICA North (USA-Canada-Mexico)
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More detailsYTV-FX 2D AOI Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsFSICL MECURRY PROCESS Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsFSICL MECURRY PROCESS Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsTRF6 HIMS-A01-T RETICLE MACRO INSPECTION TOOL(EVAL TOOL) (former LRIS-02) Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsKLA AITXUV, 300mm, s/n: UV1005R Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsWafer Size 300 mm Fab Section Metrology General Product Information Vendor Supplier KLA Singapore Model AITXU Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsTransaction Information Tool Status Disconnected Wafer Size 300 mm Fab Section Metrology General Product Info Year(s) : 2005 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsTransaction Information Tool ID YDFI735 Tool Status Disconnected Wafer Size 300 mm Fab Section Metrology Gene Year(s) : 2005 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsTransaction Information Tool ID EE-EME-03 Wafer Size 300 mm Fab Section Etch General Product Information Vend Year(s) : 2005 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsSemi-Automatic BGA Rework Station Nozzles Included Maximum Board Size: 18” x 22” (458mm x 560mm) Minimum Compo Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsKLA-TENCOR ASET F5x THIN FILM MEASUREMENT SYSTEM consisting of: - Model: ASET F5x - Configured for 300mm Wafe Year(s) : 2003 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsKLA-TENCOR PROMETRIX RS55/TC FOUR POINT PROBE RESISTIVITY MAPPING SYSTEM consisting of: - Model: RS55/tc - Tem Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.