Used Metrology and inspection equipment
1,222 resultsAligner: Mask aligner/4in Year(s) : 2010 Location : ASIA (North East)
Price : On request
More detailsInspection System Model Candela 8620 Year(s) : 2013 Location : EUROPE (Western and Northern)
Price : On request
More detailsFilm Thickness Measurement System Metrology Equipment Date of Manufacture: 2001-12-31 Currently Configured for Year(s) : 2001 Location : EUROPE (Western and Northern)
Price : On request
More detailsBrand: Koh Young Technology Power: 220V a.c Type: 3D SPI FEATURES: - Inspection speed at 0.24sec/FOV - 3D Sha Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsThin Film Stress Measurement System, 150 mm and 200 mm wafer Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsFRONT SIDE ALIGNMENT HIGH RESOLUTION ALIGNMENT FOR UP TO 4″ WAFERS SUSS POWER SUPPLY Year(s) : 2019 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details12.25×12.25 SQUARE BEAM (EXPOSURE HEAD IS MOTORIZED) 500 WATT LAMP, SPLIT FIELD VIDEO OPTICS WITH FLAT SCREEN Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsSi wafers, 200/300mm wafers, Bright and Dark Field, 0.2 um pixel size, 10.5 Soft version, RBB classification Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsSi, Gan & Gas, Saphire 150/200mm, Bright and Dark Field, 0.2 um pixel size, 10.5 Soft version, RBB classificat Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsDual 300mm FIMS – DBS, SE, Stress, 200/300 mm chuck, Win NT, Summit 3.3, upgradable Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsThin Film measurement tool Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsMetrology Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsScanning Electron Microscopes 300mm, s/n: UV1158 Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsBrightfield Inspection 300mm, s/n: 1340334 Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsLithography Equipment, 200mm, s/n: 2070 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsFilm thickness measurement, 200mm, s/n: 6454 Year(s) : 1997 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsWafer Inspection Microscopes, 200mm Year(s) : 1999 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsLithography Equipment, 200mm Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsRAIDER, 300mm, Year(s) : 2012 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsDark field defect detection tool, setup for 200mm or 300mm wafers, 2 Cameras 200 and 300mm compatible with dua Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsWafer Defect Inspection, for 150 or 200mm wafers, .25, 0.39, 0.62 um inspection spot size Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsAutomatic Wafer Optical Inspection System Robot defect but machines works fine in manual mode Year(s) : 2007 Location : EUROPE (Western and Northern)
Price : On request
More detailsUltratech Titan 4700 Stepper consisting of: - Model: Titan 4700 Stepper (Enclosure marked as 6700) - G & H Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsFully Automatic 300mm wafer prober, Dual FIMS loadport, Cold (-25c, ambiant and hot) Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsAutomated High Resolution Stylus Profiler, for 150 and 200 mm Wafer Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.