Used Testing instrument for electronics
1,691 resultsTencor M-Gage 200 * Non-Contact Wafer Monitor for Sheet resistance. * Can accommodate up to 5". * Measureme Location : AMERICA North (USA-Canada-Mexico)
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More detailsTencor M-Gage. Non-Contact Wafer Monitor for Sheet resistance. 115v, 60 hz Location : AMERICA North (USA-Canada-Mexico)
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More detailsTencor Alpha Step 250 Profilometer (Alpha Step 250 Profilometer) The Alpha-Step 250 is used to measure step Location : AMERICA North (USA-Canada-Mexico)
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More detailsKLA/Tencor Flexus 2900 diffusion coefficient in dielectric films, linear regression and stress-temp or stres Location : AMERICA North (USA-Canada-Mexico)
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More detailsKLA / Tencor AlphaStep 500 Profilometer * Computer controlled Scanning and data collection * Comprehensive d Location : AMERICA North (USA-Canada-Mexico)
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More detailsTencor Alpha Step 300 Profilometer (Alpha Step 300 Profilometer) Location : AMERICA North (USA-Canada-Mexico)
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More detailsVeeco Dektak 3030ST Auto II Profilometer. * Measurement Range: 50A to 1,310KA * Verticle Resolution: 1A * Sc Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand: Signatrone Signatrone 4 point probe * Model # 301-4 * Customer must purchase a Keithley (or equivalen Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand: Signatrone Signatrone 4 point probe * Model 301 * Customer must purchase a Keithley (or equivalent) d Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand: Semiconductor Diagnostics Inc Semiconductor Diagnostics Inc. SPV CMS 4010 (SPV CMS 4010) * Model SPV Location : AMERICA North (USA-Canada-Mexico)
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More detailsRudolph FTM ellipsometer *Precise: 1nm resolution *Fast Operation: 4 seconds per measurement *Set film type, Location : AMERICA North (USA-Canada-Mexico)
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More detailsRudolph Auto EL IV-Hg Ellipsometer Rudolph Auto EL-IV-Hg Multi-Wavelength Automatic Ellipsometer *User can se Location : AMERICA North (USA-Canada-Mexico)
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More detailsNanometrics Nanospec AFT 200 * Manual system Location : AMERICA North (USA-Canada-Mexico)
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More detailsNanometrics AFT 210UV * Nanometrics 210UV * Film Measurement System * Stage - 4" wafers - larger stage can b Location : AMERICA North (USA-Canada-Mexico)
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More detailsNanometrics Nanospec AFT 210XP Film Measurement System. *System is in excellent "like new" condition. *Read Location : AMERICA North (USA-Canada-Mexico)
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More detailsRudolph Auto EL III Ellipsometer EQP-00470 * Serial tag info: 24A, Serial # 7367, June 1983 * Ellipsometer, 6 Location : AMERICA North (USA-Canada-Mexico)
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More detailsRudolph Auto EL III Ellipsometer *Serial Tag info: 2C4C, Serial # 7511, July/1984 *Ellipsometer, 633nm wavele Location : AMERICA North (USA-Canada-Mexico)
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More detailsRudolph Auto EL II Ellipsometer *Ellipsometer, 633nm wavelength *Built-in printer *Measuring Time: 17 to 50 Location : AMERICA North (USA-Canada-Mexico)
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More detailsRudolph FE IV Ellipsometer Specifications: System: The Rudolph FE III series is a focused beam ellipsometer f Location : AMERICA North (USA-Canada-Mexico)
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More detailsNanometrics Nanoline AFT 4000 * Table top automated film thickness and reflectivity system. * Standard Film Location : AMERICA North (USA-Canada-Mexico)
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More detailsNanometrics 215 Automated Film Thickness Tool. * Cassette to cassette operation. 3¿ to 6¿ wafer capability. Location : AMERICA North (USA-Canada-Mexico)
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More detailsNanometrics Nanospec AFT 181 (Nanospec AFT 181) Computerized Film Thickness Measurement Nanometrics 181. Mic Location : AMERICA North (USA-Canada-Mexico)
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More detailsNanometrics Nanospec AFT 181 (Nanospec AFT 181) Computerized Film Thickness Measurement Nanometrics 181 with Location : AMERICA North (USA-Canada-Mexico)
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More detailsNanometrics Nanospec AFT 180 (Nanospec AFT 180) Nanometrics 180 * Microspectrophotometer head can measure in Location : AMERICA North (USA-Canada-Mexico)
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More detailsNanometrics Nanospec AFT 180 (Nanospec AFT 180) Location : AMERICA North (USA-Canada-Mexico)
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More detailsYou can find used Testing instrument for electronics on Wotol
The main manufacturers of Testing instrument for electronics are Agilent, Keysight, Hewlett Packard (HP), Tektronix, Anritsu, Teradyne, Keithley, Rohde & Schwarz, Tencor, Acterna, Advantest, Dage, Rudolph, Nanometrics, Yokogawa, ATG, Skyline Instruments, TEL, Mania, HP, Teledyne, Credence, Newport, EXFO, GenRad, Leader, Gaertner, KLA-Tencor, Seica, Marconi Instruments, Kenwood, Wei Min Industrial, Agilent Technologies,Kikusui Electronics, LTX, Spea, Veeco, Wandel & Goltermann, Associated Research, Cascade, Mosaid, Sloan, Sorensen, Tokyo Semitsu Kogaku (TSK), Viavi, Amplifier Research, Ando, B&G, ENI, Electroglas, Fluke, International Light Technologies (ILT), JDSU, Keller, Luther & Maelzer,NexTest, Nikon, Ophir, Polar, SMT, Tesec, Trio Tech, X-Rite, Accretech, Acculogic, Aeroflex, Aqueous Technologies, Bruel & Kjaer, California Instruments, Cascade Microtech, Dektak, Delta, FiberPro, Giga-tronics, IFR, ILX Lightwave, Leica, Ling Dynamic Systems, Photonetics, Precision Services, Royce, Spirent, Toray, Varian, Verigy, Ateq, Biorad, Branson, Chiron, Circuit Line, CyberOptics, Dryden Engineering, ESI, Eagle, Epson, GPD , Hewlett – Packard, Hipotronics, Hitachi.
The main modelB1500A, 11713B OPT LXI , BT-4000 , 16702B , 1670G, 34401A , N8973A , CO-1305 ,G8D-380HB , ECO1000-S, SC-6SA , (NIR-3), 577 , 203 Bubble, 481, 6000, 8851 In-Circuit Tester, Toneohm 850 , V860 , V860 24 , V875-640B , XPEQT EM , IQE200 PV , NG-10320, ML2438A, MS2691A, MS420B, Optiks TT-506,437B, AFG3022B , 9344C, IB420, SX-5124 , 4300, MF-22U, MAGNUM-PV , 124LX In-Circuit Tester, Q8383, MS9710A , 86146B, 86120C, 86141B, 86145B, JDSU HA9, 8158B, N7745A, Q8326 , N7782B , N7781B , 8156A , C5, IC5 RF, 4400 and 5500, ASL-1000, 3073 S-III, Ultra II 121, 2287i ,93000, NT510 , MG9638A Light Source, 4701, 86140B,mVIEW 100, 2284i, L115C-8, AQ6375 , AQ6330 , 4155C, RM3050B, JA Woollam M-2000,N7752A , N7714A , 81960A , TR2114 , BT-24 , -3000 , -4000, N7764A , FSM-40PM , FTB-5240B , 86143B , TSL-510 , Summit 9000, G3-24, ES-76LH , HM-90, Zero Ion, 4510, 4040, 86122A, 86120B , DSG3065B, N7762A , RSA3030E + EMI + NFP-3, N7788B ,83496A ,83493A , 83491A , MTS-505, TR8001, i5000, S450 , S3000A, Condor 100, 4504,BT-30 , IUC-M3S Meter , AEL-Ⅳ, OVS-2. 635-850-00 , 635-850-10, i1000D, Type A3, Speedy 580, Fabline D8, N4903A , 37718A/B/C , 86130A , MT9090A-MU909011A , 81680A , 81642A , AQ7275, AQ7270 , 81591B, 380499, 8510 ,Q8163 , PS3650 , 8509C , 8509B , 8169A ,WASeries,, 86100A/B/C , 8000 , 86108A , 1936-C , 1830C , MT8502, XACT830A Rel , HP83000, V3300, 7500cs-C, 1014, 1400 A,8517B,8510C,83651A,S300 ,6633A,8517B, 8510C,20DXB ,2400,S300,8510C,83651A, 8517B, 8510C,LSS A1200,LH124,3070,2287L,PK2,PK1,Kalos HEX,QS2200A,LH124, 3070,AQ7260,AQ4321D,4010RE,U3641, R3267, D3186, LDC-3724B, 8008 , MP1800A,LH124, 3070, 1000-DC-12, EM-21 , B 10, 4142B, 656A/H, ,N5231A, R3752A, E4404B-STG-B75, FPA-35, 5803068A, CBA 230M-080, R9211C, 7010 , P-11, P-2H, P-2 , P-10, FPP-5000, P-2H, P-12, FPP 100, 200 ,2908 , E3631A , MS2711A ,NSeries, E4443A , 8153A ,83438A, 11896A , 8168 , 8163A ,EXFO WA-1650,CMS52,200/S, AR-5S1G4, 2520, 2049 , Z1803 Plus-1, Z1890, 11000,VSMD30, SI 1260 , MPI LEDA-8F, 000-950-0017 , 002-00021, QS-300, MS4155 , BT24 , THDX 8", ATP-15B 1500W, DV-II+, B2G170, 1650, X-RiteSeries, 61-Optometer , X-Rite 301, SPM5A2KLB, 1650, 70512470000, SPM5F2F2KB, 2400PC, 16500B, 7859012000, 577 Curve Tracer,434, 150-40-1-0561G, 7704, Series 8300 – 8314, 54601A, BT23PC, 8314, 434, RMX12-C, 16500B, 7704, BT-23, 2400 PC PC, 16500B, 54601A,7704,QP2N1DF, BT23PC, BT-23, X-Rite 301, E2807A, S-85170-12, XFR-600-2, XTQ 7-6X, Series 8500, 260014, 86060C , ANT-20SE,ER8940A Tester ,UC-4500, JST-10F, AQ4321A , 8167B , AQ4321A , A-5 E-Tester, Exaline , A3-1X , 1936-R, Newport 0901 ,FiberPro PS-155-A , 4040, 5DX , 2445, 6645A, 2230, 2246A , 2465 ,2467 , Optical EDFA ERBIUM , 2236, BJ820, 8757D , N6731B , ESHS10, SPF2, BOP72-6D, N8940A, 1011A, ORS2488, FM/AM1200S, LSM3000, 19032, 6634A , 8991A, 53131A, MSO8064 600 MHz, 6645A DC, 53181A, 83570A, 83592C, 8753D, 8846A, 8541C, PLI 2112, 8753ES, E4419B, 1745A ,VSA, MSO8204, 8595E, 8591C , 8565EC, 8563E, 8560E, 4500A, E4418B, 1928-C , DSA8200, E4402B, FTB-500,PSSeries, 2001CX, DH 24, 481, 203 BUBBLE , 600S1G4A, 7009, 1000T1G2Z5, 7L12, NTC DVC-1300-N1, P12XLn+, N1090A, N4392A, 86100Series, 8163B, ILX Lightwave, 86140B , GP700, 80E06 , 2500, SWS15115 , SL-TSeries SL-T21, SL-LSeries, lle-855DD , MTM 32 V01 , PS 280, MS2711A, FSEA20, FSEM30, FSP13 , 82A04 , GH-202F, E8247C-520 , E8251A, N5182A-506, 8714ES,8719Series , 8719D,3283, SMT02,16901A, AWG2041,SPM33,QT200 , 11801C,MH-190-3S ,AUTO EL (NIR-3),910-A,LED-217 ,SAT-AG200,REL 3200,ID-3500,DL/LID 002, 102 Ch. Logic, OFV-3000S , OFV 1102,S320 Glonass, 20 GeoMax Zenith, V Topcon Hiper V, S120 Faro Focus S120. P8 XL QIII, 8832, 400 SE, 580, CYN-3, PM1800, SSP3190, MF22A, .0 HAL/ HASS, J750K, SZ61TR, MTD 150, MD8400C, E6393A-002-003-010 ,8256, Q3723A, 7705, 83236A , 8011A-001 ,8158B , 5315B-003 , 66106A ,1901A ,5384A .
HS code 9031 80 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.