Used Semiconductor Equipment

APM Skinpack e Blister Location : EUROPE (Western and Northern)

Price : On request

Double Stack SRD (Set up for solar wafer use) Version: 100 mm, M0, M2 Vintage: 01.02.1999 -Semitool PSC 101 -S Year(s) : 1999 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Dry Etcher Version: 200 mm De-installed from working condition and warehoused. Please refer to the attached p Location : AMERICA North (USA-Canada-Mexico)

Price : On request

This 200/ 300mm track system is built on a proven 200mm platform, the POLARIS 3500 Together with this machin Location : EUROPE (Western and Northern)

Price : On request

Automated Wafer, Die and Bump Inspection System Version: 300 mm Vintage: 01.06.2008 Dimensions on base: 72 in Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Automated Macro Defect Inspection Version: 150 mm/200 mm Automatic Shut down in Fab. Needs to be removed in t Location : AMERICA North (USA-Canada-Mexico)

Price : On request

WAFER SIZE 12 Location : EUROPE (Western and Northern)

Price : On request

[Specifications] - Compatible board size: 40 x 40 mm to 460 x 370 mm (2 kg or less) - Device size: 10 to 50 mm Year(s) : 2007 Location : ASIA (North East)

Price : On request

【Main Specifications】 ・Controller: IM-6700 ・Measuring head: IM-6225 (wide field of view/variable illumination Location : ASIA (North East)

Price : On request

【specification】 Model: Type: MD-X1020 (wide area specification) Type: XYZ3-axis simultaneous scanning method M Year(s) : 2017 Location : ASIA (North East)

Price : On request

【specification】 Printing laser: Fiber laser class 4 laser Laser wavelength: 1064nm Laser oscillator output: 20 Year(s) : 2019 Location : ASIA (North East)

Price : On request

【specification】 Printing method: XYZ3-axis simultaneous scanning method Printing laser: YVO4 laser Wavelength: Location : ASIA (North East)

Price : On request

【specification】 ・Measurement part: XM-T1000 (2 probe type) ・Controller: XM-1500 ・Measurement range: 300mm x 25 Location : ASIA (North East)

Price : On request

【specification】 ・Controller: IM-6700 ・Measuring head: IM-6225 (wide field of view/variable illumination type) Location : ASIA (North East)

Price : On request

One Shot 3D Shape Measuring Machine 【specification】 ・Year: 2015 ・Measurable height: Wide field mode 10mm, h Year(s) : 2015 Location : ASIA (North East)

Price : On request

High-Tech Science Scanning White Interference Microscope <b> specification </b> ○Observation interference mi Location : ASIA (North East)

Price : On request

IT Control System X-ray Nondestructive Inspection System <b> Specification </b> Table size: 410×360 mm Tabl Year(s) : 2017 Location : ASIA (North East)

Price : On request

Wafer Size 8" Vintage 2002-8 Tool's Condition Excellent - Long Scan Profiler P-15 Measurement. - Micro Head I Year(s) : 2002 Location : ASIA (North East)

Price : On request

<b> Specification </b> Total magnification 15-94.5× Depression angle 20° Zoom 1-6.3× Working distance approx Location : ASIA (North East)

Price : On request

【specification】 Monitor Color LCD (IPS type) 23-inch 3D display function available Photographing device (CCD) Location : ASIA (North East)

Price : On request

【specification】 Marking method: XYZ3-axis simultaneous scanning method Mark Laser: YVO4 laser (class 4) Wave l Year(s) : 2017 Location : ASIA (North East)

Price : On request

Binocular Angle 45° Eyepieces Magnification 20 X Field Number 13 mm Focusing YES Objective Model Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Accessories Heated/vacuum work stage 5.25" X 5.75" with model 1201D power supply (see photo #10) Tool heat Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Binocular Angle 45° Eyepieces Magnification 20 X Focusing YES Magnification Range 18 X - 150 X Zo Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Diffusion LPCVD Nitride x01 Reactor Wafer Size 8 Location : EUROPE (Western and Northern)

Price : On request