Used Metrology and inspection equipment
1,129 resultsBrand Mitaka Kohki Non-contact 3D measuring device 【Main Specifications】 〇Microscope section ・Expensive obser Location : ASIA (North East)
Price : On request
More detailsSurface roughness measuring machine Year: Model: 2011 Measurement range/resolution: Z axis 800μm/0.01μm, 80 Year(s) : 2011 Location : ASIA (North East)
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More detailsMeasurement range: X-axis 100mm Z1-axis detection section ±30mm from horizontal state Z2 axis (column) movem Location : ASIA (North East)
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More detailsYear: Model: 2015 Tilt mechanism: Yes (X axis, tilt angle ±45 degrees) Measurement range/resolution: X-axis 20 Year(s) : 2015 Location : ASIA (North East)
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More detailsEquipped with Magnum ion Column SFEG UHR SEM STEM capable! 5 axis stage with 100 x 100 mm XY Turbo vacuum 2 GI Location : AMERICA North (USA-Canada-Mexico)
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More detailsXray Year(s) : 2015 Location : AMERICA North (USA-Canada-Mexico)
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More details【specification】 ・Measuring head/controller: VR-3200/VR-3000 ・Observation mode: Wide field of view (12, 25, 38, Location : ASIA (North East)
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More details○Main specifications ・Stage movement: X axis 200mm, Y axis 200mm, θ axis ±5° ・Microscope stage movement: X axi Location : ASIA (North East)
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More detailsMeasurement target Seebeck coefficient Thermal conductivity (evaluate thermal conductivity by comparison with Year(s) : 2017 Location : ASIA (North East)
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More detailsImage dimension measuring instrument 【specification】 ・Controller: IM-6600 ・Measuring head: IM-6140 (high prec Location : ASIA (North East)
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More details6×6″ travel with 6″ wafer chuck New video camera and monitor 1 year warranty on parts Optional probe card hold Location : AMERICA North (USA-Canada-Mexico)
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More detailsTILTING PLATEN, 5X5″ TRAVEL, WITH 6″ DIAMETER CHUCK INCLUDES B&L STEREO ZOOM 7 OPTICS, OR CAN BE UPGRADED TO Location : AMERICA North (USA-Canada-Mexico)
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More detailsScanning Acoustic Microscope Version: Laboratory Vintage: 01.06.2010 A high-speed scanning acoustic microscope Year(s) : 2010 Location : AMERICA North (USA-Canada-Mexico)
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More detailsCompound Microscope Microscope Configuration Brightfield & Darkfield Location : AMERICA North (USA-Canada-Mexico)
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More detailsUnpatterned Wafer Surface Inspection Tool Location : AMERICA North (USA-Canada-Mexico)
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More detailsObservation method Transmission: bright field Epi-illumination: bright field, dark field, high intensity (UV) Location : ASIA (North East)
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More details6″ Probe station With 6″ chuck and 6X6″ travel Manual lifting platen, Z movement controlled by chuck Microzoom Location : AMERICA North (USA-Canada-Mexico)
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More detailsCR TECH CRX-1000 X-Ray System Location : AMERICA North (USA-Canada-Mexico)
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More detailsGE Phoenix Nanomex PCBA Analyser 160 X-Ray System Location : AMERICA North (USA-Canada-Mexico)
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More detailsModel Argos YOM 2004 Year(s) : 2004 Location : EUROPE (Western and Northern)
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More detailsBinocular Angle 45° Eyepieces Model 445111 Magnification 10 X Field Number 21 mm Focusing YES T Location : AMERICA North (USA-Canada-Mexico)
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More detailsModel M7A-DiscussionScope Binocular Angle 45°-Low Eyelevel Eyepieces Magnification 10 X Field Number Location : AMERICA North (USA-Canada-Mexico)
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More detailsBinocular Angle 45° Eyepieces Magnification 10 X Field Number 21 mm Focusing YES Magnification Ran Location : AMERICA North (USA-Canada-Mexico)
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More detailsX-Ray System Model Nanomex 160 Year(s) : 2007 Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand Omniphysics ○Main specifications ・Stage movement: X200mm, Y200mm ・Substage movement amount: X13mm, Y13m Location : ASIA (North East)
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More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.