Used Metrology and inspection equipment
1,134 resultsBinocular Angle 45° Eyepieces Magnification 10 X Field Number 21 mm Focusing YES Magnification Ran Location : AMERICA North (USA-Canada-Mexico)
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More detailsX-Ray System Model Nanomex 160 Year(s) : 2007 Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand Omniphysics ○Main specifications ・Stage movement: X200mm, Y200mm ・Substage movement amount: X13mm, Y13m Location : ASIA (North East)
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More detailsMicromanipulator System [Configuration/Specifications] ・Manipulator (left and right arms): Operating ran Location : ASIA (North East)
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More detailsMicroscope Digital Camera 【Main Specifications】 〇Control unit (DIGITAL SIGHT DS-L2) ・Brightness: 350cd/㎡ ・Sto Location : ASIA (North East)
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More detailsSystem Stereo Microscope Total magnification: 11.25x to 112.5x Body zoom: 0.75x ~ 7.5x Eyepiece: UW10x/24 Obj Location : ASIA (North East)
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More detailsProcessed material: 30 x 70 mm or 60 x 70 mm Pyrex Processing amount: 1 jig / batch Heating temperature: MAX 9 Year(s) : 2003 Location : ASIA (North East)
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More detailsModel type: Type2/103 (tip tip nominal diameter φ30μm) Measurement range: UMAP 185 x Y200 x Z175mm Image probe Location : ASIA (North East)
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More detailsHITACHI CG4100, 300mm Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)
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More detailsHg-CV measurement system Version: up to 12 inch Vintage: 01.01.2004 - Capable up to 12" Wafer - SSM 52 Capac Year(s) : 2004 Location : AMERICA North (USA-Canada-Mexico)
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More detailsULTRATECH LSA100A, s/n: 6125, 300mm Location : AMERICA North (USA-Canada-Mexico)
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More details8″ uv flood exposure system, cassette to cassette. Location : AMERICA North (USA-Canada-Mexico)
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More detailsMicroscope Configuration Brightfield, Darkfield & DIC Illumination Type Reflected & Transmitted Light Trinoc Location : AMERICA North (USA-Canada-Mexico)
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More detailsOEM SAT Spray Acid Etch Tool Version: Clamshell Automatic Shut down in Fab. Needs to be removed in the next f Location : AMERICA North (USA-Canada-Mexico)
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More detailsUltra SPI Solder Paste Inspection Machine Upgraded with Windows 7 Year(s) : 2018 Location : AMERICA North (USA-Canada-Mexico)
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More details300mm (12″ INCH) CHUCK 300mm (12″ INCH) X 300mm (12″ INCH) TRAVEL ANORAD TABLE NEW MOTORS (covered by 6 month Location : AMERICA North (USA-Canada-Mexico)
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More detailsSpin RInser/Dryer Model ST-270D Location : EUROPE (Western and Northern)
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More detailsTencor Candela 2 is an optical metrology system manufactured by KLA Corporation. It is primarily used in the Location : AMERICA North (USA-Canada-Mexico)
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More detailsSpectroscopic ellipsometry: Measures the change in polarization state of light reflected from a sample to de Location : AMERICA North (USA-Canada-Mexico)
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More detailsThe Model DE3496 provides particle concentrations per in.2 or cm2 in five sizes from 0.3 µm to 10 µm. It mea Location : AMERICA North (USA-Canada-Mexico)
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More detailsBare Wafer Surface Defect Inspection System Max Wafer Capable: 8”/200mm System configured for 8“/200mm wafers Location : AMERICA North (USA-Canada-Mexico)
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More detailsCapable of 2" - 8" wafers Low angle optics Non-Patterned surface Inspection System 0.10 micron Defect Sensitiv Location : AMERICA North (USA-Canada-Mexico)
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More detailsOur Particle Deposition System SST-1500is the only tool in the semiconductor industry that produces the high Location : AMERICA North (USA-Canada-Mexico)
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More detailsIt features a dual-laser profilometer, an optical inspection module, and an imaging acquisition machine. Th Location : AMERICA North (USA-Canada-Mexico)
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More detailsNot only does the KLA ADE Tencor Ultragage 9500 offer exceptional accuracy and versatility, but it also boas Location : AMERICA North (USA-Canada-Mexico)
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More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.