Used Metrology and inspection equipment
1,232 resultsMeasurement/Thickness /6in. Year(s) : 1995 Location : ASIA (North East)
Price : On request
More detailsElec: Probe card inspection Location : ASIA (North East)
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More details5150 Description Elec: Probe card inspection Location : ASIA (North East)
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More details5200 Description Elec: Probe card inspection Location : ASIA (North East)
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More detailsOther: Frequency Sorter Location : ASIA (North East)
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More detailssawing machine Year(s) : 2005 Location : EUROPE (Western and Northern)
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More detailsCondition: Very Good Configuration: 12" Wafer sorter with: 2x Fixload V6 Multiple IOSS Wafer ID Reader 2x Bro Year(s) : 2001 Location : EUROPE (Western and Northern)
Price : On request
More detailsPCB Size supported: From L50mm x W 50mm to L460mm x W360mm Inspection time: 0.2sec / inspection area Year(s) : 2006 Location : ASIA (South East)
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More details60A Spin/Expose/Develop Year(s) : 1997 Location : AMERICA North (USA-Canada-Mexico)
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More details80 B Coat/Track 56700-3354 Year(s) : 1997 Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer ID Reader Optical Inspect Location : AMERICA North (USA-Canada-Mexico)
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More detailsYTV-FX 2D AOI Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)
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More detailsSemi-Automatic BGA Rework Station Nozzles Included Maximum Board Size: 18” x 22” (458mm x 560mm) Minimum Compo Year(s) : 2014 Location : AMERICA North (USA-Canada-Mexico)
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More detailsKLA-TENCOR PROMETRIX RS55/TC FOUR POINT PROBE RESISTIVITY MAPPING SYSTEM consisting of: - Model: RS55/tc - Tem Location : AMERICA North (USA-Canada-Mexico)
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More detailsBare Wafer Surface Defect Inspection System The Surfscan 6400 is a highly advanced inspection system desig Location : AMERICA North (USA-Canada-Mexico)
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More detailsSurface Inspection System Location : AMERICA North (USA-Canada-Mexico)
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More detailsUnpatterned Surface Inspection System Location : AMERICA North (USA-Canada-Mexico)
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More detailsIn addition to its advanced data analysis software, the ADE 7200 offers a user-friendly interface that makes Location : AMERICA North (USA-Canada-Mexico)
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More detailsThe system features a high-resolution, double-sided non-contact measurement array with a sophisticated silic Location : AMERICA North (USA-Canada-Mexico)
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More details[Specifications] ○Measurement unit: XM-1200 ○Controller: XM-1500 ○Measurement range: 600mm x 300mm x 200mm ○Im Location : ASIA (North East)
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More detailsMask Aligner With 150mm Backside Chuck Cassette to Cassette 1000 Watt Light Source Location : AMERICA North (USA-Canada-Mexico)
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More details10″ COLLIMATED LENS FOR UP TO 6X6″ SQUARES OR 200mm WAFERS DUAL VIDEO CAMERAS ABOVE AND BELOW MASK 500 WATT P Location : AMERICA North (USA-Canada-Mexico)
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More detailsUsed, looks complete, very clean Manufacturer ALSI Model DCM802 Laser Separation System w/ LCPU, Wafer Location : EUROPE (Western and Northern)
Price : On request
More detailsMetal film measurement system Version: 150-200 mm Vintage: 01.06.2006 Condition: Good. Configuration notes: MP Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsThin film measurement tool Broadband UV optics Dual beam spectrophotometry Wafer sizes: 100mm, 150mm, and 200m Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.