Used Metrology and inspection equipment
1,253 resultsBroadband spectrometry for film thickness and trench profile measurements on photomask reticles. Spotsize: R = Year(s) : 2005 Location : ASIA (North East)
Price : On request
More details- Standard Head with L(yellow) type stylus. - Measurement Range: 13㎛,300㎛. - Scan Length: 210mm. - Scan Speed Year(s) : 1995 Location : ASIA (North East)
Price : On request
More details- Cassette Handling - Laser: Circumferential(50mW, 405nm), Radial(85mW, 660nm) - Spot size: 5㎛ x 4㎛. - Handler Year(s) : 2011 Location : ASIA (North East)
Price : On request
More details- Laser: Circumferential(50mW, 405nm), Radial(85mW, 660nm) - Spot size: 5㎛ x 4㎛. - Particle detection: smaller Year(s) : 2011 Location : ASIA (North East)
Price : On request
More details*.Measurement -Wafer: 8" -Speed: 5 sec. for 150mm wafer. -Range: 2x10E7 ~ 4x10E7 dyne/cm2 -RMS Noise: 0.0001 m Year(s) : 1993 Location : ASIA (North East)
Price : On request
More details*. Fully refurbished. *. Installed in Clean-room. *. Can demonstrate any time. Wafer Size 8" Location : ASIA (North East)
Price : On request
More detailsProcess: Spreading resistance probe *. Measurement perfomance: - Resistivity and Dopant concentration - Resist Year(s) : 1999 Location : ASIA (North East)
Price : On request
More detailsIn-lens Field Emission Scanning Electron Microscope. Imgae Resolution : - 0.4nm guaranteed at accelerating vo Location : ASIA (North East)
Price : On request
More detailsMicroscope : - Model :OLYMPUS MX50A-F - Objectives :5X,10X,20X,50X,150X Motorize objectives 2. Autoloader Location : ASIA (North East)
Price : On request
More detailsCS-201- R rotary bin, full off trays All manuals (complete) Year(s) : 2011 Location : AMERICA North (USA-Canada-Mexico)
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More detailsSpatial Resolution 20 line-pairs/mm (standard) 100 line-pairs/mm (w/ optional 10 μm x-ray source) Ano Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand: Manncorp Manncorp Sherlock-300F Benchtop AOI Machine Maximum PCB Size 13" x 9.85" (330 mm x 250 mm) 2 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsBrand: Manncorp Manncorp BC Series Inspection / Linking Conveyors PCB Size 50 mm L x 50 mm W to 530 mm L x 4 Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand: Manncorp Manncorp Sherlock-300I Inline AOI Machine Minimum PCB Size 2" x 2" (50 mm to 50 mm) Maximum Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsspecifications -Piezo drive method: Revolver drive ・ Piezo scanning range: 100 μm * Measurement is about 90 μm Location : ASIA (North East)
Price : On request
More detailscomplete Location : ASIA (China - Taiwan - HKG)
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More details5011 Location : ASIA (China - Taiwan - HKG)
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More detailsTrench for as-is wafer size: 150mm Location : ASIA (China - Taiwan - HKG)
Price : On request
More details800 RIE Oxford Location : ASIA (China - Taiwan - HKG)
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More detailsHTO PROCESS lP SIN TEOS PROCESS Year(s) : 1997 Location : ASIA (China - Taiwan - HKG)
Price : On request
More detailsEXCALIBUR 2000 Location : ASIA (China - Taiwan - HKG)
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More detailsS5000 Location : ASIA (China - Taiwan - HKG)
Price : On request
More detailsS-7800H Critical Dimension Scanning Electron Microscope (CD-SEM), 4″-8″ Automatic cassette to cassette wafer l Location : ASIA (China - Taiwan - HKG)
Price : On request
More detailsS8820 Location : ASIA (China - Taiwan - HKG)
Price : On request
More detailsS 5000 Location : ASIA (China - Taiwan - HKG)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.