Used Metrology and inspection equipment
1,251 resultsDimension 3100 AFM X-Y imaging area approx. 90um square Z range approx. 6um up to 150mm sample size nanoscope Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsMaximum 6" wafers Includes rotor for 6"x6" substrates Static eliminators Resistivity monitor PSC-101 controlle Year(s) : 2008 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsspin dryer with 150mm wafer carrier Location : AMERICA North (USA-Canada-Mexico)
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More detailsmax 5" diameter substrate or 4"x4" square CT-60 controller max 5000 rpm with steps of 10 rpm substrate thickne Location : AMERICA North (USA-Canada-Mexico)
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More details6 axis translation stage: all axes are motorized Configuration from bottom to top: Large Goniometer: Roll Sing Location : AMERICA North (USA-Canada-Mexico)
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More detailsFS60 microscope with 2/5/10/20 objectives Location : AMERICA North (USA-Canada-Mexico)
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More detailsultra high resolution remote control XY travel range 10mm Z range 8mm 0.2 micron resolution Location : AMERICA North (USA-Canada-Mexico)
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More detailsset of 4 programmable positioners, north, south, east, west includes cables and interface boards for PA200 pro Location : AMERICA North (USA-Canada-Mexico)
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More detailsmanual 6" prober with B&L Microzoom 2 Fiber optic light source and adaptor 5" vacuum chuck Location : AMERICA North (USA-Canada-Mexico)
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More detailsSCA-50 software package ver. 1.21 Build 74 WT200E motorized measuring stage adjustable in 3 axes. Lens mount w Location : AMERICA North (USA-Canada-Mexico)
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More detailsSemiautomatic prober with 4" wafer chuck Mitutoyo FS-50 microscope with lamphouse motorized microscope xy with Location : AMERICA North (USA-Canada-Mexico)
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More detailsSemiautomatic prober with 150mm (6â€) nickel plated vacuum chuck. B&L Microzoom II microscope with 2.5, 8x, 2 Location : AMERICA North (USA-Canada-Mexico)
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More detailsFACTS 2 Acoustic Scanning Microscope, model DF2200, 110v Year(s) : 2006 Location : AMERICA North (USA-Canada-Mexico)
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More detailsDescription: Delta 80+ photoresist coater Gyrset closed cover coating technology Wafer size up to 200mm 2 Waf Location : AMERICA North (USA-Canada-Mexico)
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More detailsLoc8 Light, S/N 18310012 without Software Location : EUROPE (Western and Northern)
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More detailsMicroscope Location : EUROPE (Western and Northern)
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More details5 kW-Maschine. A modification up to 8 kW is possible (with new Software and guarantee). Upper drawer in order, Year(s) : 2002 Location : EUROPE (Western and Northern)
Price : On request
More detailsRepair Station, Type Veri Smart VRL-OL Year(s) : 2006 Location : EUROPE (Western and Northern)
Price : On request
More details3 X 400 V~ / 50 Hz B (width) m / T (depth) m H (height) m / G (weight) t ja (yes) wird geprueft (gets chec Location : EUROPE (Western and Northern)
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More detailsStaub 6 kW Device with additional Glass pane so that the Film not by warming warps including various new spar Location : EUROPE (Western and Northern)
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More detailsVintage: 12/2018 Benchtop 3D Automated Optical Inspection System Direct Loading Max PCB Size: 520mm Orca Chas Year(s) : 2018 Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More details150mm Manual Analytical Wafer Prober. Vacuum Chuck: 6” dia. (150mm). Manual XY stage movement: 6” X x 6” Y. P Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsManual Analytical Wafer Probe Station. Wafer prober designed to support a broad range of precision probing ap Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsView Pinnacle 250 Video Measuring Tool. The Pinnacle features a damped granite base and column, with passive Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsS-1160MW-D6 Manual 6" Analytical Wafer Prober. Manual Probe System designed for reliable and accurate analytic Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.