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Used Metrology and inspection equipment

1,129 results
1

AMC 7700 EPI Reactor with Moore Uniformity Kit *. Process: Epilayer growth on silicon wafer *. Operational a Location : ASIA (North East)

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Brand: LEO/KOBELCO LEO/KOBELCO LTA-700 Wafer Lifetime Mesurement System Wafer Size 6" Variiable Injection Ty Year(s) : 1997 Location : ASIA (North East)

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Brand: SEMILAB SDI/SEMILAB WT-2000 Basic units WT-2000 main unit with scanning capability Sample stage (max Year(s) : 2007 Location : ASIA (North East)

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SSM 5200 Automatic CV System for CV/QV/IV measurement Fully automated capacitance-voltage(CV),charge-voltage( Year(s) : 1997 Location : ASIA (North East)

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Hitachi SEM S-4160 Performance: Rresolution: 2.5 nm at 30kv Magnification: 20X - 300KX Electron Optics: Elec Location : ASIA (North East)

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Hitachi SEM S-5000 - 30KV 0.6nm - 1 KV 2.5nm with a test specimen *.Magnification 20X ~ 300,000X *. Stage Year(s) : 1996 Location : ASIA (North East)

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N&K 5700 CDRT Metrology system Broadband spectrometry for film thickness and trench profile measurements on p Year(s) : 2006 Location : ASIA (North East)

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NIDEK IM-11 5" Wafer Autoloader - Nidek wafer auto loader. - 5" wafer. - Power: 120V, 5A - Utility: Vacuum. Location : ASIA (North East)

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NIDEK 8" Wafer Autoloader IM-14 - 8" wafer. - Power: 120V, 5A - Utility: Vacuum. *. Fully refurbished. Fully Location : ASIA (North East)

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Nikon NWL641M Wafer Autoloader IC Inspection Wafer Loader Wafer Size : 4~6" Inspection mode : Micro & Tilt M Year(s) : 2001 Location : ASIA (North East)

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AMC 7700 EPI Reactor Wafer Size 6" *. Process: Epilayer growth on silicon wafer *. Operational at the time o Location : ASIA (North East)

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Nikon Eclips L200 Microscope Wafer Size 8" Installed in Clean-room. *. Can demonstrate any time Location : ASIA (North East)

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Olympus MX80-F Microscope (up to 300mm wafer) Wafer Size 12" * 200/300 mm wafer size * OBJECTIVES :5/10/20/50 Location : ASIA (North East)

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Zeiss Axiotron HSEB Microscope Wafer Size 8" *. Modified auto stage movement. *. Attached additional scope he Location : ASIA (North East)

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Tencor HRP220 Step Height Measurement Sytem Wafer Size 8" Measurement Capabilities for meeting the requiremen Year(s) : 2000 Location : ASIA (North East)

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Leica INS3000 Defect Inspection System Wafer Size 8" Year(s) : 1999 Location : ASIA (North East)

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Leica INS3300 Defect Inspection System Wafer Size 12" Currently stocked in cleanroom. Year(s) : 2003 Location : ASIA (North East)

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Rudolph/August AXI 930 Macro Inspection System Wafer Size 8" Macro Inspection System to detect wafer level an Location : ASIA (North East)

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Rudolph/August AXI-S Macro Inspection System Wafer Size 8" Macro Inspection System to detect wafer level and Location : ASIA (North East)

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Tencor FLX-2908 Thin Film Stress Measurement Wafer Size 8" Installed in Clean-room. Location : ASIA (North East)

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KLA-Tencor's 2401 Automated Macro Defect Inspection System Wafer Size 8" - Replacing the manual bright light Year(s) : 2001 Location : ASIA (North East)

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KLA-Tencor's 2401 Automated Macro Defect Inspection System Wafer Size 8" - Replacing the manual bright light Year(s) : 2000 Location : ASIA (North East)

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BIO-RAD/Accent QS-408M FT-IR Wafer Size 8" *. BIO-RAD FTIR QS-408. *. BPSG,EPI. *. Installed in Clean-room. * Year(s) : 1996 Location : ASIA (North East)

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N&K 1700 Trench Depth & Thin film thickness Measurement Wafer Size 8" * .Available 100,125,150,200 mm by chuc Location : ASIA (North East)

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N&K 3000 Trench Depth & Thin film thickness Measurement Wafer Size 6" Non-destructive measurements of Trench Location : ASIA (North East)

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You can find used Metrology and inspection equipment on Wotol

The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.

The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XS5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.

HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors. 

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