Nanometrics NaoSpec/AFT 200, Film Thickness Measurement System
Ref :
1232712-9-W
Condition :
Used
Manufacturer :
Nanometrics
Model :
NaoSpec/AFT 200, Film Thickness Measurement System
Year(s) :
-
Quantity :
1
Location :
Seller or machines location:
AMERICA North (USA-Canada-Mexico)
AMERICA North (USA-Canada-Mexico)
Last check :
16 Apr. 2020
Used
Manufacture : Nanometrics
Model : NaoSpec/AFT 200
Model Number : 7001-0081
Desc : Film Thickness Measurement System
Details:
Wafer Size : Up to 6"
Standard films measured silicon dioxide and nitride,
negative and positive resists, nitrides, oxides, and polyimides
- Measures from 400A to 40,000A
- Measures in the 480-790 nm wavelength range
- 10x eyepieces
- M5x0.1, M10x0.25, and M100x0.90 objectives
- Computer Controller : model: 7201-1045, s/n:0986-cs-2-2089
- printer (model: 20-03050)
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