Menu

Nanometrics 9000

Ref : 2674595-9-CP
Condition : Used
Manufacturer : Nanometrics
Model : 9000
Year(s) : 2005
Quantity : 1
Location : Seller or machines location:
AMERICA North (USA-Canada-Mexico)

Nanospec Wafer Metrology film thickness measurement tool
Version: 200 mm

Other machines similar to Nanometrics 9000

1
Location : AMERICA North (USA-Canada-Mexico)
1
Location : EUROPE (Western and Northern)
Year(s) : 2006
1
Location : AMERICA North (USA-Canada-Mexico)
Year(s) : 2000
1
Location : AMERICA North (USA-Canada-Mexico)
Year(s) : 2009