Used Semiconductor Equipment

Nikon Eclips L200 Microscope Wafer Size 8" Installed in Clean-room. *. Can demonstrate any time Location : ASIA (North East)

Price : On request

Olympus MX80-F Microscope (up to 300mm wafer) Wafer Size 12" * 200/300 mm wafer size * OBJECTIVES :5/10/20/50 Location : ASIA (North East)

Price : On request

Zeiss Axiotron HSEB Microscope Wafer Size 8" *. Modified auto stage movement. *. Attached additional scope he Location : ASIA (North East)

Price : On request

Tencor HRP220 Step Height Measurement Sytem Wafer Size 8" Measurement Capabilities for meeting the requiremen Year(s) : 2000 Location : ASIA (North East)

Price : On request

Leica INS3000 Defect Inspection System Wafer Size 8" Year(s) : 1999 Location : ASIA (North East)

Price : On request

Leica INS3300 Defect Inspection System Wafer Size 12" Currently stocked in cleanroom. Year(s) : 2003 Location : ASIA (North East)

Price : On request

Rudolph/August AXI 930 Macro Inspection System Wafer Size 8" Macro Inspection System to detect wafer level an Location : ASIA (North East)

Price : On request

Rudolph/August AXI-S Macro Inspection System Wafer Size 8" Macro Inspection System to detect wafer level and Location : ASIA (North East)

Price : On request

Tencor FLX-2908 Thin Film Stress Measurement Wafer Size 8" Installed in Clean-room. Location : ASIA (North East)

Price : On request

KLA-Tencor's 2401 Automated Macro Defect Inspection System Wafer Size 8" - Replacing the manual bright light Year(s) : 2001 Location : ASIA (North East)

Price : On request

KLA-Tencor's 2401 Automated Macro Defect Inspection System Wafer Size 8" - Replacing the manual bright light Year(s) : 2000 Location : ASIA (North East)

Price : On request

BIO-RAD/Accent QS-408M FT-IR Wafer Size 8" *. BIO-RAD FTIR QS-408. *. BPSG,EPI. *. Installed in Clean-room. * Year(s) : 1996 Location : ASIA (North East)

Price : On request

N&K 1700 Trench Depth & Thin film thickness Measurement Wafer Size 8" * .Available 100,125,150,200 mm by chuc Location : ASIA (North East)

Price : On request

N&K 3000 Trench Depth & Thin film thickness Measurement Wafer Size 6" Non-destructive measurements of Trench Location : ASIA (North East)

Price : On request

N&K 3700 RT Metrology System Wafer Size 8" Vintage 2004 Broadband spectrometry for film thickness on transpar Year(s) : 2004 Location : ASIA (North East)

Price : On request

N&K 8000 Trench Depth & Thin film thickness Measurement Wafer Size 8" Vintage 2007 Fully Automated Thin Film Year(s) : 2007 Location : ASIA (North East)

Price : On request

Nanometrics Nanospec 9300 Thin Film Thickness Measurement Wafer Size 12" Vintage 2002 Currently 12" configure Year(s) : 2002 Location : ASIA (North East)

Price : On request

Tencor P-2 Step Height Measurement System - Wafer Size 8" - Long Scan Profiler Measurement. - Standard Head w Location : ASIA (North East)

Price : On request

Tencor P-20(H) Step Height Measurement Sytem - Wafer Size 8" - Scan Length: 210mm. - Scan Speed : 1㎛ ~ 25 mm/ Location : ASIA (North East)

Price : On request

ILX 1000 Inline X-Ray System Year(s) : 2017 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Quanta 200 FEG SEM Field Emission Gun Scanning Electron Microscope fitted with OXFORD Instruments 6650-M EDS D Location : AMERICA North (USA-Canada-Mexico)

Price : On request

Etch 11-A Plasma System with PD-IIA, Model PE11A, Serial# 401053, Technics PD-IIA, Serial# 403033 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

PLC controlled and offers real-time plain English readout of system operating parameters together with re Location : AMERICA North (USA-Canada-Mexico)

Price : On request

3D AOI Year(s) : 2017 Location : AMERICA North (USA-Canada-Mexico)

Price : On request

VT-RNS II Inline AOI Machine Location : AMERICA North (USA-Canada-Mexico)

Price : On request