Used Metrology and inspection equipment
1,129 resultsErgolux Microscope Location : AMERICA North (USA-Canada-Mexico)
Price : On request
More detailsUM-2 operates with transmission and reflection modes as well as bright field and dark field modules. System co Location : AMERICA North (USA-Canada-Mexico)
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More detailsStage module A(R) with 5 dovetail slide rails. Objective module with sextuple revolving nosepiece (LD-Plan Location : AMERICA North (USA-Canada-Mexico)
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More detailsST Surface Profiler Location : AMERICA North (USA-Canada-Mexico)
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More detailsNanoSpec AFT 200 Thickness Measurement System Location : AMERICA North (USA-Canada-Mexico)
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More detailsMA25 mask aligner configured for simultaneous double side exposure and manual operation of wafers with a maxim Location : AMERICA North (USA-Canada-Mexico)
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More detailsMA 56 is a mask alignment and exposure system which offers unsurpassed, highly economical mass production capa Location : AMERICA North (USA-Canada-Mexico)
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More detailsMICRASCAN MPT 193nm Scanner SVG DUV (193nm) stepper configured for processing 200mm wafers and linked to TEL A Location : AMERICA North (USA-Canada-Mexico)
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More details<b>1x KLA TENCOR, SM300, PROMETRIX Description</b> Film Thickness Spectramap Location : AMERICA North (USA-Canada-Mexico)
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More details- PC w/ windows XP - Maximum Throughput: 1 minute per wafer - Measurement Range: 2 mΩ/- 5 MΩ/ - Minimum Edge E Location : AMERICA North (USA-Canada-Mexico)
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More detailsWafer Size 6 or 8 inch Mercury Xenon Lamp Light level sensor with adjustable 2x Mag Tubes X/Y/Z drive/controll Location : AMERICA North (USA-Canada-Mexico)
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More detailsStandard Ducting DFIHS Phoenix v2.0 VQ Line Cond. 45kVA 25 Cassette HH, 300mm SW 300mm: DSH 065, Haze, Shiny 2 Location : AMERICA North (USA-Canada-Mexico)
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More detailsSet up for 6” or 8" Dual open loader Double Darkfield Inspection Tool Standard features Modular Inspection Sta Location : AMERICA North (USA-Canada-Mexico)
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More detailsRudolph Technologies Model August NSX95 Conation Id 564 Configuration Serial Number: X1232; PC # 1224; NSX Com Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand: SC Raziel Diamond SRL SC Raziel Diamond SRL Model SCI 4000EUV Conation Id TQ073 Configuration Filmtek Location : AMERICA North (USA-Canada-Mexico)
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More detailsRigaku Model MFM65 Conation Id 583 Configuration X-Ray Inspection Location : AMERICA North (USA-Canada-Mexico)
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More detailsKLA-Tencor Model 5100 Conation Id I-0001 Configuration KLA - Tencor Overlay tool Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand: Novellus Novellus Model 04-8132929-00 Conation Id TQ019 Configuration Chem Monitoring System, CU Location : AMERICA North (USA-Canada-Mexico)
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More detailsKLA-Tencor Model Spectra SWE Conation Id 509c Configuration KLA - Tencor Spectra SWE Single wave Ellipsometry Location : AMERICA North (USA-Canada-Mexico)
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More detailsKLA-Tencor TP 420XP TQ098 420XP (200000079558) Location : AMERICA North (USA-Canada-Mexico)
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More detailsBrand: POLY FLOW ENGINEERING POLY FLOW ENGINEERING S-1055-1 (200000062075) TQ095 Location : AMERICA North (USA-Canada-Mexico)
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More detailsLocation : AMERICA North (USA-Canada-Mexico)
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More detailsINSPECTION MICROSCOPE WITH FOCEA SYSTEM Location : EUROPE (Western and Northern)
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More detailsExcellent and very clean condition. Equipment details: Haxagon Camera 8 pices 2.2 D Inspection Double Convey Year(s) : 2003 Location : EUROPE (Western and Northern)
Price : On request
More detailsbasic board inspection blue vacuum-underscreen-cleaner 400 mm ASM-adjustable screen mount squeegee head with Year(s) : 2003 Location : EUROPE (Western and Northern)
Price : On request
More detailsYou can find used Metrology and inspection equipment on Wotol
The main manufacturers of Metrology and inspection equipment are KLA-Tencor, Nanometrics, Rudolph, YESTech, Hitachi, Veeco, Bausch & Lomb, Nikon, Mirtec, Tencor, FEI, Bio-Rad, Prometrix, KLA, Accent Optical, Accretech, ADE, AG Associates, Agilent, Air-Vac, Alcatel, Alessi, Applied Materials, ATG, August Technology, Bruker, Camtek, Canon, Cascade, Cascade Microtech, Cencorp , CR Technology, Cyber Optics, CyberOptics, Dage, Dektak, DNS, Electroglas, Feinfocus, Four Dimensions, Gaertner, Glenbrook, Jeol, Jordan Valley, Karl Suss, Koh Young, Lasertec, Leica, Leitz, Lenz, Mania, Manncorp, Marantz, MDC (Materials Development Corporation), MEK, Micromanipulator, MVP, N&K Technology, Neslab, Nicolet, Nidek, Nordson, Olec, Olympus, Omron, Opti-Probe, Orbotech, Phoenix, Plasmos, Pluritec, Quick, Rigaku, Robotic Visions Systems (RVSI), Rucker & Kolls, Rudolph Research, Saki, SDI Diagnostics, Seiko, Semitool, Signatone, Sloan, Solid State Measurements (SSM), Sonoscan,Suss, T I, TEL, Temptronics, Thermawave, Tokyo Cathode, Tokyo Semitsu Kogaku (TSK), Trio Tech, Varian, Viscom, Vision Engineering, VJ Electronix, Wentworth, Wyko, ZEISS.
The main model SFX200, YTVSeries, 7090CT, VL-M6000, JSM-6060LV, AL3100, AITSeries, SP1-TBI, MVSeries, SST-F-421-280-FK,FE-VII, SCOV-8594, BHMJL, 8840, NSX, FACTS2, 350D, FT-650, PH600HF, SE400adv-16, EZlaze, 680e, S-302-8, 6-axis, α-801D, XRF3640[Handle, FPASeries, S-9380,, eP4, eScan, Viper, CRS1010, SLF576, S27-S-3-1-ML-WP, DFG-840,V200SMicrion,3640, EB700, Alpha-Step, INS3300, CVP-320, 20180122-333, FC-3100, AIT-UV, D3100AFM, Alessi, TPO3020B-2300-1, REL-4100, DEKTAK3ST, V695, 210, I-20, 3577, XT, S2088-ii, M1900, DSeries, LPX, LC361C, BF-Planet, BF-Comet18, CLM, 3630, LEA, Win-Win, YTX-X1, RTX-113HV, AutoInspector, Onyx298, 2033C, MP2020, JWS7500E, AXI-S, Ultrastep, LS-5000, UMA-802-HC551NY, SCW-622-B, XＳ5-Ⅱ,Analyzer, MV-2HTX, LKX-IRT-2017R2, MX40,020-559.025, Uvision, EpiScan, PLS-600, IS-5, 4400, ES31, 20DXB, IVS, 7600, Swift, SM200, Flexus, 8000, 210, S-8820, 8000x, 4500, 979, UL500, RS35, 4500, S301-4, CD-50-2, 466, S300, 8000, S-8820, UV1250SE, 4150, 210, SM200, 4000, 4500, CD-50-2, RS35, S301-4, 6200,LX22DL-520, PowerSpector,XD7500VR, SK-80BW-BVP, RTP-600xp, TR2400, XD7500VR, FOV200, AT-24AS, 300XP, Onyx29, SP50, F1, XDAL, RD-500, VIS100W, CM460-22, NT8000, 120-1014, FLX2320-S, SDB, Laserplotter, RS, TR2400, 3F5VT-WIN-L3HE-CE, MV-3L(R3), SD-2004,QS-1200, QS-408, 1-124-05, QS-1200,, S-7000, 3640, Magna-IR, QS-300, SZ3060, SD2000, V-12, REL-4500, Optiphot, 3640, QS-408M, S-7000, QSeries, CC-S, Episcan, CC-S, M76, MC2100HE,6000X, RD-500, 5702R, TVP60-GT, SPIRON8800, VT-MUS, Faps60, FAPS, HMW, CCD, MPP, AutoInspector, Triple, Illumia, YTX-X3, 1000, YTX-X3, P12XLM, STK-05W-G-MP550, 465, 9000, M200, 8667, X90, s6055, TS3, M22X, XD760-NT, S9300, S4160, DT-MSM-1030A,RF1, TPO3010B, PH150, CMS3, AFT4000, State, S-5500, State, MX61, MX50A-F, IM-11, WH208, OP2600, LTA-700, P-10, MCV530, Eclips ECO , Archer, AL100-L8,QS-408M, HRP220, P-11, HRP100, NWL641M, Olympus,P-20(H), 7700, Optiphot, P-20(H), Candela, Polyvar, Hisomet-II, MX80F, VIPER, AL100-L8, Reichert, S-4160, IM-14, Archer, 6400F, HSEB, S-5000, VIPER, AL100-L8, P-2, FLX-2908, 3180, Benchtop, Verifast, XD7500, XD7600NT,ACT8, 5100XP,2K, V510, YTV-FX, FLX-2320, SP1, ASET, CTR-200, PowerSpector, YTV-F1, HELIOS, 1010, Strata, 4700-II, 4800-I, XL30, Tecnai, 7000, XL40, Altura, CM200, DA300, 5500, Tecnai, CMSeries, 3000N, 4500, 4700-I,5200, S3088, PZ, M22Xfv-350, i12D, MA6, CB-200, Delta,200, 6420, UltraScan, 6200, P20H, 6220, Surfscan, ST-921R-AA, 2600, C-35, 1007-47, NSX-115, NSX, SherlockSeries, 1300, TP03010B, CM30, Single, VX340, MVP-250, DJ-853V, OP2600, 420, E220, MT7700/7700K, TWINSCAN, maxi, RTX-113, OPL, RMSeries 6100, IIA, CRS1010, P-10, Therm, 200D, FLX-5500, NSX-80,UV-1070, HRP, 3030, MFM65, D9000, NT3300, NT1100, YTV-B3, AXIOTRON, E800, Onyx25XLT, SMZ660, RTX-113, BF-PLANET-XII, FXS-160.40, 2915, 2135, Acrotec, 1001, OP2600, TR6132U, RS35, SM300, TR6133UD, 53-450000-001, U1100, 8100E, 53-450000-001, OP5340, Cougar, SMZ-1B, WST406MG, 7505, ST-495, X8011, L116-C8, ERGULUX, 2132, MHL-525MS, MT2168, DLG.
HS code 9031 40 00 for other machinery from 9031 Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.