Yokogawa GS210 DC test equipment

From traditional semiconductor characterization to quantum computing, the GS200 is purposely designed to handle increasingly complex scenarios
Source and sink in all four quadrants; generate endless combinations of test scenarios
Generate pulse width modulation, ramp, step, and arbitrary waveforms

Use as a storage device or integrate into an automated test system
Upload and download setup files, test patterns, and test results with a simple press of a button
No programming or software development required

Featuring extremely low-noise current and voltage sourcing capabilities, the GS200 provides the perfect stimulus whether used for a short while or several days
Synchronize multiple units to boost voltage or current without losing accuracy or resolution