Veeco FPP-5000 Probers

The Veeco FPP-5000 4-Point Probe simplifies the
measurement of resistive properties
of semiconductor wafers and resistive films.

The electronics and probing mechanism is contained in
a single compact package.
The rugged cast aluminum housing assures
mechanical integrity of the probe mechanism.
The probing mechanism features a constant force probe
head which is rigidly fixed in the housing.

Unlike most four point probes and
probing stations, which move the probe head into the wafer,
the FPP- 5000 is designed so that the wafer is
moved into the probe head.
This insures constant probe force independent of
operator force and wafer thickness.