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Semilab CMS3 non contact sheet resistance measuring system
Ref :
2158770-9-W
Condition :
Used
Manufacturer :
-
Model :
Semilab CMS3 non contact sheet resistance measuring system
Year(s) :
-
Quantity :
1
Location :
Seller or machines location:
AMERICA North (USA-Canada-Mexico)
AMERICA North (USA-Canada-Mexico)
Last check :
29 Jan. 2024
Meas. technique: non-contact, junction photovoltage (JPV)
Sample size: 100 to 156 mm (210mm option)
Sample structure: np or pn junctions
Measurement range: 10 Ω/sq. to 200 Ω/sq.
Probe distance: 1.5 mm probe height above transport bel
Wafer vertical position tolerance: < 400 μm
Sample support: on belt
Calibration: by wafers verified with four point probe
Options:
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