Nanometrics 210
Ref :
2633251-9-CP
Condition :
Used
Manufacturer :
Nanometrics
Model :
210
Year(s) :
-
Quantity :
1
Location :
Seller or machines location:
AMERICA North (USA-Canada-Mexico)
AMERICA North (USA-Canada-Mexico)
The Nanospec 210 is a wafer tester that
has a film thickness measurement system.
It has a 100 angstrom resolution.
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