Nanometrics 210

Ref : 2633251-9-CP

Condition : Used

Manufacturer : Nanometrics

Model : 210

Year(s) : -

Quantity : 1

Location : Seller or machines location:
AMERICA North (USA-Canada-Mexico)

The Nanospec 210 is a wafer tester that
has a film thickness measurement system.
It has a 100 angstrom resolution.

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