N&K Technology 1700

N&K 1700 Trench Depth & Thin film thickness Measurement

Wafer Size 8"
* .Available 100,125,150,200 mm by chuck change
*. Wavelength range : 190nm ~1000nm (UV/VIS)
*. Spot size : 50± 5 μm
*. Pentium PC & LCD Monitor
*. Windows Operating System / N&K Technology Analysis & Simulation SW
*. Standard Films Library
*. Stage Motion Control : NI NuDrive Multiaxis controller
*. X-Y Stage Travel : 200x200 mm
*. Film Thickness Measurement, Trench Depth Measurement(Option)
*. AC 100~120V, Single Phase, 15A, 50-60Hz