KLA-Tencor P-10 Surface Profiler

Manual wafer load profilometer
Max wafer size: 8"/200mm
Computer controlled
Measures roughness, waviness, step height, and other surface characteristics
Measures micro-roughness with up to 0.5Å (0.002 min.) resolution over short distances as well as waviness over a full, 60-mm scan.i thin
Built-in PC computing power
Operating System: Windows 3.1
Windows base software control and data analysis
Brand new stylus
Brand new LCD monitor
Lab Table for KLA P10 Profiler
Operations Manual
Refurbished to Meet Original KLA-Tencor P-10 Specifications
Available for Full Inspection and Demonstration!
6 Months Warranty on Parts and Labor (Stylus is not covered under warranty)

More Information about the KLA P-10 Profiler:
Measurement of vertical features ranging from under 100Å (0.4 min.) to approximately 300 µm (11 mils), with a vertical resolution of 0.5, 2, or 10Å.
A virtually unlimited number of data points per profile guarantee that the horizontal resolution is limited by the stylus radius and not by the number of data points.
Measurement of many roughness and waviness parameters, with user-selectable cutoff filters to isolate roughness and waviness.
Ability to fit and level a scan, allowing accurate step height measurements on curved surfaces.
Ability to detect the edge or apex of a profile feature, allowing automated data analysis relative to the feature.
The KLA P-10 to repeat a scan up to ten times and automatically calculate the average, thereby minimizing the effects of environmental noise on measurements.

KLA-Tencor P10 can profile a variety of materials including:
- Semiconductor wafers
- Thin-film heads
- Precision-machined and polished surfaces
- Ceramics for micro-electronics
- Glass for flat panel displays
- Optical surfaces

CONDITION:
Excellent Condition Guaranteed.
Fully Reconditioned to Factory Specifications by ClassOne.
6 Month Warranty and Full Specifications Guarantee.
30 Day Right of Return.
As-Is / Where-Is Pricing is Also Available.